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Publications

NIST Authors in Bold

Displaying 1851 - 1875 of 49898

SIM Time Scale: 10 years of operation

Author(s)
J. M. Lopez, Michael A. Lombardi, E. de Carlos, N. Munoz, C. Ortiz
The Inter-American Metrology System (SIM) is one of the world's five major Regional Metrology Organizations (RMO's). Starting in 2005, the SIM Time and

Safeguards for Securing Virtualized Servers

Author(s)
Ramaswamy Chandramouli, Larry Feldman, Gregory A. Witte
This bulletin summarizes the information found in NIST SP 800-125A: Security Recommendations for Hypervisor Deployment on Servers, which provides technical

Deuterated silicon nitride photonic devices for broadband optical frequency comb generation

Author(s)
Jeffrey T. Chiles, Nima Nader, Daniel D. Hickstein, Su Peng Yu, Travis Briles, David R. Carlson, Hojoong Jung, Jeffrey M. Shainline, Scott A. Diddams, Scott B. Papp, Sae Woo Nam, Richard P. Mirin
We report and characterize low-temperature, plasma-deposited deuterated silicon nitride films for nonlinear integrated photonics. With a peak processing

Testing IoT Systems

Author(s)
Jeffrey M. Voas, David R. Kuhn, Phil Laplante
The ability to test systems that are based on the underlying products and services commonly referred to as the Internet of 'things' (IoT) is discussed. The role

An Analytical Framework for Smart Manufacturing

Author(s)
Peter O. Denno, Amogh Kulkarni, Daniel Balasubramanian, Gabor Karsai
Smart manufacturing is an emerging paradigm for the next generation of manufacturing systems. One key to the success of smart manufacturing is the ability to

Small Low-Depth Circuits for Cryptographic Applications

Author(s)
Joan Boyar, Magnus G. Find, Rene C. Peralta
We present techniques to obtain small circuits which also have low depth. The techniques apply to typical cryptographic functions, as these are often specified

Non-Resonant Valence-to-Core X-ray Emission Spectroscopy of Niobium

Author(s)
Bruce D. Ravel, A. J. Kropf, Dali Yang, Mengen Wang, Mehmet Topsokal, Deyu Lu, M. C. Stennett, N. C. Hyatt
The valence-to-core (V2C) portion of X-ray Emission Spectroscopy (XES) measures the electron 15 states close to the Fermi level. These states are involved in

Spin-torque excitation of perpendicular standing spin waves in coupled YIG/Co heterostructures

Author(s)
Stefan Klinger, Vivek P. Amin, Stephan Gepraegs, Kathrin Ganzhorn, Hannes Maier-Flaig, Matthias Althammer, Hans Huebl, Rudolf Gross, Robert D. McMichael, Mark D. Stiles, Sebastian Goennenwein, Mathias Weiler
We investigate yttrium iron garnet (YIG)/cobalt (Co) heterostructures using broadband ferromagnetic resonance (FMR). We observe an efficient excitation of
Displaying 1851 - 1875 of 49898