Megahertz-rate Ultrafast X-ray Scattering and Holographic Imaging at the European XFEL

Published

August 23, 2022

Author(s)

Thomas J. Silva, Hans Nembach, Mark Keller, Justin Shaw, Nanna Hagstrom, michael schneider, Nico Kerber, Alexander Yaroslavtsev, Erick Parra, Eric Fullerton, Oleg Shpyrko, Christian Gutt, Hermann Durr, Ezio Iacocca, Roopali Kukreja, stefano Bonetti, Emmanuelle Jal

Abstract

The advent of X-ray free-electron lasers (XFELs) has revolutionized fundamental science, from atomic to condensed matter physics, from chemistry to biology, giving researchers access to X-rays with unprecedented brightness, coherence, and pulse duration. All XFEL facilities built until recently provided X-ray pulses at a relatively low repetition rate, with limited data statistics. Here, we present the results from the first megahertz repetition rate X-ray scattering experiments at the Spectroscopy and Coherent Scattering (SCS) instru- ment of the European XFEL. We illustrate the experimental capabilities that the SCS instrument offers, resulting from the operation at MHz repetition rates and the availability of the novel DSSC 2D imaging detector. Time-resolved magnetic X-ray scattering and holo- graphic imaging experiments in solid state samples were chosen as representative, providing an ideal test-bed for operation at megahertz rates. Our results are relevant and applicable to any other non-destructive XFEL experiments in the soft X-ray range.

Citation

Journal of Synchrotron Radiation

Volume

29

Pub Type

Journals

Download Paper

https://doi.org/10.1107/S1600577522008414

Local Download

Keywords

X-ray scattering, free-electron laser, holography

Citation

Silva, T. , Nembach, H. , Keller, M. , Shaw, J. , Hagstrom, N. , Schneider, M. , Kerber, N. , Yaroslavtsev, A. , Parra, E. , Fullerton, E. , Shpyrko, O. , Gutt, C. , Durr, H. , Iacocca, E. , Kukreja, R. , Bonetti, S. and Jal, E. (2022), Megahertz-rate Ultrafast X-ray Scattering and Holographic Imaging at the European XFEL, Journal of Synchrotron Radiation, [online], https://doi.org/10.1107/S1600577522008414, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935238 (Accessed October 8, 2025)