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NIST Authors in Bold

Displaying 24326 - 24350 of 74235

On-chip, photon-number-resolving, telecommunication-band detectors for scalable photonic information processing

December 5, 2011
Author(s)
Thomas Gerrits, Nick Thomas-Peter, James Gates, Adriana E. Lita, Benjamin Metcalf, Brice R. Calkins, Nathan A. Tomlin, Anna E. Fox, Antia A. Lamas-Linares, Justin Spring, Nathan Langford, Richard P. Mirin, Peter Smith, Ian Walmsley, Sae Woo Nam
Integration is currently the only feasible route towards scalable photonic quantum processing devices which are sufficiently complex to be genuinely useful in computing, metrology, and simulation. Embedded on-chip detection will be critical to such devices

Reversible effect of strain on transport critical current in Bi 2 Sr 2 CaCu 2 O 8+x superconducting wires: A modified descriptive strain model

December 5, 2011
Author(s)
Najib Cheggour, Xifeng Lu, T G. Holesinger, Theodore C. Stauffer, J Jiang, Loren F. Goodrich
A reversible strain effect on transport critical current I c was found in Bi 2Sr 2CaCu 2O 8+x (Bi-2212) high-temperature superconducting round wires. I c showed unambiguous reversibility at 4 K and 16 T up to an irreversible strain limit of about 0.3 % in

Versus: A Framework for General Content-Based Comparisons

December 5, 2011
Author(s)
Peter Bajcsy, Antoine Vandecreme, Benjamin J. Long, Paul Khouri Saba, Joe Chalfoun, Luigi Marini, Devin Bonnie, Rob Kooper, Michal Ondrejcek, Kenton McHenry
Abstract—We present a framework for the execution and dissemination of customizable content-based file comparison methods. Given digital objects such as files, database entries, or in-memory data structures, we are interested in establishing their

Recommended Auger Parameters for 42 Elemental Solids

December 4, 2011
Author(s)
Cedric J. Powell
Values of the Auger parameter are presented for 42 elemental solids. These values were determined from evaluated Auger-electron kinetic energies and photoelectron binding energies (BEs). Small adjustments were made to earlier values of photoelectron BEs to

MOSFETs made from GaN nanowires with fully conformal cylindrical gates

December 2, 2011
Author(s)
Paul T. Blanchard, Kristine A. Bertness, Todd E. Harvey, Aric W. Sanders, Norman A. Sanford, Steven M. George, Dragos Seghete
We report novel metal-oxide-semiconductor field effect transistors (MOSFETs) based on individual gallium nitride (GaN) nanowires with fully conformal cylindrical gates. The W/Al 2O 3 gates were deposited by atomic layer deposition. Reverse-bias breakdown

A Large-Signal Model of Ferroelectric Thin-Film Transmission Lines"

December 1, 2011
Author(s)
Eduard Rocas, Juan C. Collado Gomez, Jordi Mateu, Nate Orloff, James Booth, Juan M. O'C allaghan
"This work evaluates the microwave nonlinear properties and tuning at RF frequencies of ferroelectric Ba0.3Sr0.7TiO3 thin-films by on-wafer measurements of the second and third-order harmonics and intermodulation products of several coplanar transmission

Annex 47 Report 1: Commissioning Overview

December 1, 2011
Author(s)
Chlo? Legris, Daniel Choiniere, Natascha S. Milesi-Ferretti
This report summarizes part of the work of IEA-ECBCS Annex 47 Cost-Effective Commissioning of Existing and Low Energy Buildings. It is based on the research findings from the participating countries. The publication is an official Annex report. Report 1,

Automated Data Processing and Quantification in Polymer Mass Spectrometry

December 1, 2011
Author(s)
Till Gruendling, Christopher Barner-Kowollik, William E. Wallace, Charles M. Guttman, Anthony J. Kearsley
An overview is given of some new techniques in quantitative composition and molecular mass distribution measurement of synthetic polymers by mass spectrometry. New concepts in data analysis, including peak picking and integration, are also described.

Combining Results from Multiple Evaluations of the Same Measurand

December 1, 2011
Author(s)
Raghu N. Kacker, Klaus-Dieter Sommer
According to the Guide to the Expression of Uncertainty in Measurement (GUM), a result of measurement consists of a measured value together with its associated standard uncertainty. The measured value and the standard uncertainty are interpreted as the

Computing Network Reliability Coefficients

December 1, 2011
Author(s)
Elizabeth R. Moseman, Isabel M. Beichl, Francis Sullivan
When a network is modeled by a graph and edges of the graph remain reliable with a given probability p, the probability of the graph remaining connected is called the reliability of the network. One form of the reliability polynomial has as coefficients

Ductile-Fracture Resistance in X100 Pipeline Welds Measured with CTOA

December 1, 2011
Author(s)
Elizabeth S. Drexler, Philippe P. Darcis, Christopher N. McCowan, Jeffrey W. Sowards, Joseph D. McColskey, Thomas A. Siewert
A test for evaluation of resistance to ductile fracture (crack tip opening angle, CTOA) was found to reveal changes in crack propagation through the strain and strength gradients near weld joints in X100 pipeline steels. This test provides a long ligament

How well do you know your MATES???

December 1, 2011
Author(s)
Joy P. Dunkers
There is a group that quietly goes about the business of advancing the areas of tissue engineering and regenerative medicine. I say quietly because their work, while impactful, is not well known outside of government circles. How well do you know your

Letter to the Editor of the CTBUH Journal

December 1, 2011
Author(s)
Sivaraj Shyam-Sunder, Jason D. Averill, Fahim Sadek
NIST was invited to comment on the articles written for a special issue of the CTBUH Journal, marking the ten years passed since the 2001 9/11 attacks on the World Trade Center. This letter to the editor reacts to the role of the NIST WTC Investigation
Displaying 24326 - 24350 of 74235
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