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Imaging and Micronaylsis of Supported Metal Catalysts in the Analytical Electron Microscope

Published

Author(s)

Christopher J. Kiely, Andrew Herzing

Abstract

The modern analytical electron microscope (AEM) is a powerful and versatile tool for the characterization of supported metal catalysts. The combination of atomic resolution images with chemical sensitivity at comparable length scales via X-ray energy dispersive spectroscopy (XEDS) and electron energy-loss spectroscopy (EELS) is ideally suited to elucidating the nature of the active sites within such materials. In this chapter, an overview of the imaging and spectroscopic signals is undertaken, with a particular emphasis on their application to supported metal catalysts.
Citation
Supported Metals in Catalysis, 2nd edition, James A. Anderson and Marcos Fernandez, Garcia (editors), ICP Press
Publisher Info
Imperial College Press, London, -1

Keywords

catalysis, STEM, TEM, AEM, EELS, EFTEM, XEDS, microanalysis, microscopy

Citation

Kiely, C. and Herzing, A. (2011), Imaging and Micronaylsis of Supported Metal Catalysts in the Analytical Electron Microscope, Supported Metals in Catalysis, 2nd edition, James A. Anderson and Marcos Fernandez, Garcia (editors), ICP Press, Imperial College Press, London, -1 (Accessed July 12, 2024)

Issues

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Created November 30, 2011, Updated October 12, 2021