U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Imaging and Micronaylsis of Supported Metal Catalysts in the Analytical Electron Microscope

Published

Author(s)

Christopher J. Kiely, Andrew Herzing

Abstract

The modern analytical electron microscope (AEM) is a powerful and versatile tool for the characterization of supported metal catalysts. The combination of atomic resolution images with chemical sensitivity at comparable length scales via X-ray energy dispersive spectroscopy (XEDS) and electron energy-loss spectroscopy (EELS) is ideally suited to elucidating the nature of the active sites within such materials. In this chapter, an overview of the imaging and spectroscopic signals is undertaken, with a particular emphasis on their application to supported metal catalysts.
Citation
Supported Metals in Catalysis, 2nd edition, James A. Anderson and Marcos Fernandez, Garcia (editors), ICP Press
Publisher Info
Imperial College Press, London, -1
Pub Type
Book Chapters

Keywords

catalysis, STEM, TEM, AEM, EELS, EFTEM, XEDS, microanalysis, microscopy
Composition and structure

Citation

Kiely, C. and Herzing, A. (2011), Imaging and Micronaylsis of Supported Metal Catalysts in the Analytical Electron Microscope, Supported Metals in Catalysis, 2nd edition, James A. Anderson and Marcos Fernandez, Garcia (editors), ICP Press, Imperial College Press, London, -1 (Accessed December 4, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 30, 2011, Updated October 12, 2021