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Displaying 23276 - 23300 of 73741

Nanoscale Fullerene Compression of an Yttrium Carbide Cluster

April 13, 2012
Author(s)
Jianyuan Zhang, Fuhrer Tim, Wujun Fu, Jiechao Ge, Dan Bearden, Jerry Dallas, Duchamp James, Kenneth Walker, Hunter Champion, Hugo Azurmendi, Kim Harich, Harry C. Dorn
The encapsulation of clusters (or small molecules) in spheroidal fullerene cages provides a unique isolated environment that is important in describing their shape, dynamics, and physical properties. For the case of yttrium carbide clusters, we find that

Battery Discharge Characteristics of Wireless Sensors in Building Applications

April 11, 2012
Author(s)
Wenqi Guo, William M. Healy, Mengchu Zhou
Sensor nodes in wireless networks often use batteries as their source of energy, but replacing or recharging exhausted batteries in a deployed network can be difficult and costly. Therefore, prolonging battery life becomes a principal objective in the

Ultimate bending strength of Si nanowires

April 11, 2012
Author(s)
Gheorghe Stan, Sergiy Krylyuk, Albert Davydov, Igor Levin, Robert F. Cook
Test platforms for the ideal strength of materials are provided by almost defect-free nanostructures (nanowires, nanotubes, nanoparticles, for example). In this work, the ultimate bending strengths of Si nanowires with radii in the 20 nm to 60 nm range

Carbon Storage Properties of OMS-2 Manganese Oxide

April 10, 2012
Author(s)
Lan (. Li, Eric J. Cockayne, Laura Espinal, Winnie K. Wong-Ng
Manganese oxide OMS-2 material, also known as alpha-MnO2, exhibits CO2 sorption hysteresis at pressures > 7 bar. Our experiments show that the hysteretic behavior strongly depends on time, temperature and pressure. To understand the atomic structures and

Membrane Association of the PTEN Tumor Suppressor: Molecular Details of the Protein-Membrane Complex from SPR Binding Studies and Neutron Reflection

April 10, 2012
Author(s)
Siddharth Shenoy, Prabhanshu Shekhar, Frank Heinrich, Maria-Claire Daou, Arne Gericke, Alonzo H. Ross, Mathias Loesche
The structure and function of the PTEN phosphatase is investigated by studying its membrance affinity and localization on in-plane fluid, thermally disordered synthetic membrane models. The membrane association of the protein depends strongly on membrane

Patterned Defect & CD Metrology by TSOM Beyond the 22 nm Node

April 10, 2012
Author(s)
Ravikiran Attota, Abraham Arceo, Benjamin Bunday, Victor Vertanian
Through-focus scanning optical microscopy (TSOM) is a novel method [1-8] that allows conventional optical microscopes to collect dimensional information down to the nanometer level by combining two-dimensional optical images captured at several through

Residual Layer Thickness Control and Metrology in Jet and Flash Imprint Lithography

April 10, 2012
Author(s)
Ravikiran Attota, Shrawan Singhal, Sreenivasan S.V.
Jet-and-Flash Imprint Lithography (J-FIL) has demonstrated capability of high-resolution patterning at low costs. For accurate pattern transfer using J-FIL, it is imperative to have control of the residual layer thickness (RLT) of cured resist underneath

Contour Metrology using Critical Dimension Atomic Force Microscopy

April 9, 2012
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Andras Vladar, Bin Ming, Michael T. Postek
The critical dimension atomic force microscope (CD-AFM), which is used as a reference instrument in lithography metrology, has been proposed as a supplemental instrument for contour measurement and verification. However, although data from CD-AFM is

On CD-AFM bias related to probe bending

April 9, 2012
Author(s)
Vladimir A. Ukraintsev, Ndubuisi George Orji, Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Richard M. Silver
Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm to 20 nm in diameter, are now frequently used. Several recent publications have reported on

Bilateral Comparison between NIST and PTB for Flows of High Pressure Natural Gas

April 6, 2012
Author(s)
Aaron N. Johnson, B Mickan, H. Toebben, Tom Kegel
In 2009 NIST developed a U.S. national flow standard to provide traceability for flow meters used for custody transfer of pipeline quality natural gas. NIST disseminates the SI unit of flow by calibrating a customer flow meter against a parallel array of

Time dependent CO2 sorption hysteresis in a one-dimensional microporous octahedral molecular sieve

April 6, 2012
Author(s)
Laura Espinal, Winnie K. Wong-Ng, Andrew J. Allen, Daniel W. Siderius, Chad R. Snyder, Eric J. Cockayne, Lan (. Li, James A. Kaduk, Anais E. Espinal, Steven L. Suib, Chun Chiu
A critical challenge in the development of novel carbon capture materials with engineered porous architectures is to understand and control the phenomenon of sorption hysteresis, whereby the path to adsorption of gas molecules by the porous host differs

Shear and dilational interfacial rheology of surfactant-stabilized droplets

April 5, 2012
Author(s)
Jeffrey D. Martin, Kendra A. Erk, Jonathan T. Schwalbe, Frederick R. Phelan Jr., Steven Hudson
A new measurement method is suggested that is capable of probing the shear and dilational interfacial rheological responses of small droplets, those of size comparable to real emulsion applications. Freely suspended aqueous droplets containing surfactant

Determination of Perfluorinated Alkyl Acid Concentrations in Biological Standard Reference Materials

April 4, 2012
Author(s)
Jessica L. Reiner, Jennifer M. Lynch, Michele M. Schantz, Steven O'Connell, Craig M. Butt, Scott Mabury, Jeff Small, Amila De Silva, Derek Muir, Amy D. Delinsky, Mark J. Strynar, Andrew B. Lindstrom, William K. Reagen, Michelle Malinsky, Sandra Schafer, Christiaan Kwadijk
Standard Reference Materials (SRMs) are homogeneous, well-characterized materials that are used to validate measurements and improve the quality of analytical data. The National Institute of Standards and Technology (NIST) has a wide range of SRMs that

OVERVIEW OF THE TESTING PROGRAM ON FIBERS USED IN BALLISTIC APPLICATIONS

April 4, 2012
Author(s)
Amanda L. Forster, Haruki Kobayashi, Jae H. Kim, Michael A. Riley, Joy Dunkers, Scott Wight, Kirk D. Rice, Gale A. Holmes
The goal of this paper and presentation is to give an overview of the research effort to date being conducted at the National Institute of Standards and Technology on polymeric fibers used in soft body armor (SBA) and a discussion of future directions. The

Resource Letter SS-1: The Spin-Statistics Connection

April 4, 2012
Author(s)
Catalina Curceanu, John Gillaspy, R. C. Hilborn
This Resource Letter provides a guide to the literature on the Spin-Statistics Connection and related issues such as the Pauli Exclusion Principle and particle indistinguishability. Journal articles and books are cited for the following topics: basic

Scatterfield Microscopy of 22 nm Node Patterned Defects using Visible and DUV Light

April 4, 2012
Author(s)
Bryan M. Barnes, Martin Y. Sohn, Francois R. Goasmat, Hui Zhou, Richard M. Silver, Abraham Arceo
Smaller patterning dimensions and novel architectures are fostering research into improved methods of defect detection in semiconductor device manufacturing. This initial experimental study, augmented with simulation, evaluates scatterfield microscopy to
Displaying 23276 - 23300 of 73741
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