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NIST Authors in Bold

Displaying 2326 - 2350 of 2503

Comparison of AlGaAs oxidation in MBE and MOCVD grown samples

January 1, 2002
Author(s)
Y Chen, Alexana Roshko, Kristine A. Bertness, Dennis W. Readey, Marc A. Mansfield, M. Tan, A. Tandon
Simultaneous wet thermal oxidation of MBE and MOCVD grown Al xGa 1-xAs layers showed that the epitaxial growth method does not influence the oxidation rate. Nearly identical oxidation depths were measured for samples grown by both techniques. It was found

Integrating Spheres for Mid- and Near-Infrared Reflection Spectroscopy

January 1, 2002
Author(s)
Leonard M. Hanssen, K A. Snail
Integrating sphere instrumentation has historically been the primary analysis tool for accurate quantitative characterization of reflectance and absorptance of samples and materials that exhibit a high degree of scattering. We present a review of

Phase Control of Li 2 Wave Packets on Two Electronic Curves

January 1, 2002
Author(s)
H U. Stauffer, J B. Ballard, Z Amitay, S R. Leone
Coherent dynamics of rotational wave packets in two Li 2 electronic states are manipulated using phase-tailored femtosecond pulses. A shaped preparation pulse simultaneously creates wave packets in the A{ 1ς u +) electronic states, subsequently ionized

Physics Laboratory Annual Report 2001

January 1, 2002
Author(s)
K B. Gebbie, William R. Ott
This report summarizes research projects, measurement method development, calibration and testing, and data evaluation activities that were carried out during calendar year 2001 in the NIST Physics Laboratory. These activities are in the areas of electron

Two-Species Magneto-Optical Trap With 40 K and 87 Rb

January 1, 2002
Author(s)
J Goldwin, S Papp, B. L. DeMarco, D S. Jin
We trap and cool a gas composed of 40K and 87 Rb, using a two-species magneto-optical trap (MOT). This trap represents the first step towards cooling the Bose-Fermi mixture to quantum degeneracy. Laser light for the MOT is derived from laser diodes and

Upgrades to the NIST/DARPA EUV Reflectometry Facility

December 1, 2001
Author(s)
Charles S. Tarrio, Thomas B. Lucatorto, S Grantham, M B. Squires, Uwe Arp, Lu Deng
We have recently installed a new sample chamber at the NIST/DARPA EUV Reflectometry Facility at the National Institute of Standards and Technology. The chamber replaces a much smaller system on Beamline 7 at the Synchrotron Ultraviolet Radiation Facility

Excellent charge offset stability in a Si-based single-electron tunneling transistor

November 5, 2001
Author(s)
Neil M. Zimmerman, W H. Huber, Akira Fujiwara, Yasuo Takahashi
We have measured the long-term drift and the short-term 1/f noise in the charge offset Q0(t) in two Si-based single-electron tunneling transistors (SETTs). In contrast to metal-based SETTs, these devices show excellent charge stability, drifting by less

A Mercury-Ion Optical Clock

September 9, 2001
Author(s)
James C. Bergquist, U Tanaka, Robert E. Drullinger, Wayne M. Itano, David J. Wineland, Scott A. Diddams, Leo W. Hollberg, E A. Curtis, Christopher W. Oates, T Udem

Analysis of Thin Layer Structures by X-Ray Reflectometry

July 1, 2001
Author(s)
R Deslattes, R J. Mayti
The well-established structural methods of X-ray specular and diffuse scattering are less widely used in semiconductor metrology than their capababilities would suggest. We describe some technical enhancements that make these highly useful tools even more

Temperature-Dependent Behavior of PbSc 1/2 Nb 1/2 O 3 From First Principles

July 1, 2001
Author(s)
Eric J. Cockayne, Benjamin P. Burton, L Bellaiche
We study the ferroelectric phase transition in PbSc1/2Nb1/2O3 (PSN) using a first-principles effective Hamiltonian approach. Results for PSN with NaCl-type ordering of Sc and Nb on the B sites shows that a Pb-centered effective Hamiltonian is appropriate

JILA, National Institute of Standards and Technology, and University of Colorado at Boulder

May 1, 2001
Author(s)
D Z. Anderson, J E. Faller, M J. Holland, L Kolvalenko, S R. Leone, R McCray, David Nesbitt
The revised JILA brochure, written for those interested in NIST programs as well as for prospective graduate students, postdoctoral associates, and visiting fellows, provides an overview of JILA and its mission, and explains the joint nature of the

Interferometric measurement of refractive-index change in photosensitive glass

April 1, 2001
Author(s)
Tasshi Dennis, E. M. Gill, Sarah L. Gilbert
We report on a technique for determining the change in the refractive index of photosensitive glass. We have demonstrated our interferometer-based technique on fiber preform and bulk glass samples, achieving an optical: path-difference (OPD) repeatability
Displaying 2326 - 2350 of 2503
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