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Displaying 2101 - 2125 of 5222

Traceability for Aerosol Electrometer in the fA Range

June 1, 2013
Author(s)
Dean G. Jarrett, Miles Owen
Described here are the configurations and procedures used to provide traceability to electrical standards for an aerosol electrometer calibration in the range ± 20 fA to ± 40 fA. The technique used here simulated the condition of a current induced when

The Development and Implementation of Quality Assurance Programs to Support Nutritional Measurements

May 24, 2013
Author(s)
Lane C. Sander, Mary Bedner, David L. Duewer, Katrice A. Lippa, Melissa M. Phillips, Karen W. Phinney, Catherine A. Rimmer, Michele M. Schantz, Katherine E. Sharpless, Susan Tai, Jeanice M. Brown Thomas, Stephen A. Wise, Laura J. Wood, J. M. Betz, Paul M. Coates
The National Institute of Standards and Technology administers quality assurance programs devoted to improving measurements of nutrients and related metabolites in foods, dietary supplements, and serum and plasma samples. These programs have been developed

Writing Guidelines to Develop an Memorandum of Understanding for Interoperable Automated Fingerprint Identification Systems

May 14, 2013
Author(s)
Susan M. Ballou, Michael Garris, Anthony Clay, Joi Dickerson, Peter T. Higgins, Lisa Jackson, Joe Morrissey, Beth Owens, Joe Polski, Janet Hoin, Leo Norton, Melissa Taylor
This is one of a series of documents prepared by the Latent Print Automated Fingerprint Identification System (AFIS) Interoperability Working Group. The purpose of these documents is to provide guidance and a framework to those involved in the

High Accuracy Measurements Using a Scanning System with a Single Point Triangulation Sensor

May 13, 2013
Author(s)
Theodore D. Doiron, Wei Ren, Eric S. Stanfield, Balasubramanian Muralikrishnan, Christopher J. Blackburn
The capabilities of non-contact laser spot triangulation sensors for high accuracy measurements have slowly increased over the past decade, and now have usable resolution below 0.1 µm. The Dimensional Metrology Group has developed a simple scanning system

Metrology for Lab-on-a-Chip Final-Product Devices

May 12, 2013
Author(s)
Darwin R. Reyes-Hernandez, Michael W. Halter, Jeeseong Hwang
New metrology tools to measure the critical parameters of internal structures in lab on a chip devices are greatly needed in order to develop standard tests for this technology. Here we present a method that combines a custom made optical coherence
Displaying 2101 - 2125 of 5222
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