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Displaying 1176 - 1200 of 1931

Distribution and Retention of 137 Cs in Sediments at the Hanford Site, Washington

September 1, 2001
Author(s)
J P. McKinley, Cynthia J. Zeissler, J M. Zachara, R J. Serne, Richard M. Lindstrom, H T. Schaef, R D. Orr
sium-137 and other contaminants have leaked from many of the single-shell storage tanks at the Hanford Site in southeastern Washington. The leakage was into sandy unconsolidated sediments consisting largely of quartz, plagioclase, micas, smectite, and

In Situ Raman Spectroscopic Investigation of Chromium Surfaces Under Hydrothermal Conditions

August 1, 2001
Author(s)
James E. Maslar, Wilbur S. Hurst, Walter J. Bowers Jr., Jay H. Hendricks, M I. Aquino, Igor Levin
Three chromium coupons were exposed to air-saturated water at pressures of ca. 25 MPa and temperatures up to 545 C in an optically accessible flow cell. In situ Raman spectra were collected at different temperatures as the coupons were heated and then

Reference Minerals for Microanlaysis of Light Elements

August 1, 2001
Author(s)
M D. Dyar, M Wiedenbeck, D Robertson, I R. Cross, J S. Delaney, K Ferguson, C A. Francis, E D. Grew, C V. Guidotti, R L. Hervig, J M. Hughes, J Husler, W Leeman, A V. McGuire, D Rhede, H Roth, Rick L. Paul, I Richards, J Yates, M Yates

SRM 482 Revisited After 30 Years

August 1, 2001
Author(s)
Eric S. Windsor, R Carlton, Scott A. Wight, C Lyman
The National Institute of Standards and Technology's (NIST) Standard Reference Material (SRM) 482 was issued by The National Bureau of Standards (NBS) in 1969 and has been continuously available to the public for over 30 years [1]. The standard consists of

Structural Effects in the Growth of Giant Magneto Resistance (GMR) Spin Valves

August 1, 2001
Author(s)
M. Menyhard, G. Zsolt, P. J. Chen, Cedric J. Powell, Robert D. McMichael, William F. Egelhoff Jr.
An investigation has been made of the thin-film structure and interface morphology of giant magnetoresistance (GMR) spin valves of the cobalt/copper/cobalt (Co/Cu/Co) type that were grown on polycrystalline NiO substrates at three different temperatures

Isotopic Ratio Measurements by Time-of-Flight Secondary Ion Mass Spectrometry

July 1, 2001
Author(s)
Albert J. Fahey, S R. Messenger
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is often considered synonymous with SIMS in the static limit where the ion fluence on the sample surface is so low that damage is negligible. For this same reason its use in measuring isotopic

Mass Flow Research and Standards: NIST Workshop Results

July 1, 2001
Author(s)
Robert F. Berg, David S. Green, G E. Mattingly
A recent workshop at the National Institute of Standards and Technology (NIST) identified research and standards that will benefit users and manufacturers of mass flow controllers and related equipment. The workshop identified problems with flow
Displaying 1176 - 1200 of 1931
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