Wight, S.
(2001),
Experimental Data and Model Simulations of Beam Spread in the Environmental Scanning Electron Microscope, Scanning
(Accessed December 15, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Experimental Data and Model Simulations of Beam Spread in the Environmental Scanning Electron Microscope
Published
Author(s)
Abstract
This work describes the comparison of experimental measurements of electron beam spread in the environmental scanning electron microscope with model predictions. Beam spreading is the result of primary electrons being scattered out of the focused beam by interaction with gas molecules in the low vacuum specimen chamber. The scattered electrons form a skirt of electrons around the central probe. The intensity of the skirt depends on the gas pressure in the chamber, beam-gas path length, beam voltage, and gas composition. A model has been independently developed which under a given set of conditions predicts the radial intensity of the beam skirt were made under controlled conditions for comparison with model predictions of beamskirting. The model predicts the trends observed in the experimentally determined scattering intensities however there does appear to be a systemmatic deviation from the measurements.Citation
Scanning
Volume
23
Issue
No. 5
Pub Type
Journals
Keywords
beam spread, electron microscope, electron scattering, environmental SEM, ESEM Monte Carlo, model, simulation, skirt
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created October 1, 2001, Updated February 19, 2017