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Displaying 1001 - 1025 of 1931

Automated Analysis of Organic Particles Using Cluster SIMS

June 1, 2004
Author(s)
John G. Gillen, Cynthia J. Zeissler, Christine M. Mahoney, Abigail P. Lindstrom, Robert A. Fletcher, P Chi, Jennifer R. Verkouteren, David S. Bright, R Lareau, M Boldman
Cluster primary ion bombardment combined with secondary ion imaging is used in an ion microscope secondary ion mass spectrometer for the spatially resolved analysis of organic particles on various surfaces. Compared to the use of monoatomic primary ion

Effects of Materials Chemistry and Morphology on Conductometric Sensor Signals

February 1, 2004
Author(s)
Douglas C. Meier, Stephen Semancik
Observation of conductance changes in material films upon their interactions with gas phase molecules is the basis of operation of the chemical microsensors being developed in the Chemical Sciences and Technology Laboratory at NIST. These interactions are
Displaying 1001 - 1025 of 1931
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