Automated Analysis of Organic Particles Using Cluster SIMS

Published

June 1, 2004

Author(s)

John G. Gillen, Cynthia J. Zeissler, Christine M. Mahoney, Abigail P. Lindstrom, Robert A. Fletcher, P Chi, Jennifer R. Verkouteren, David S. Bright, R Lareau, M Boldman

Abstract

Cluster primary ion bombardment combined with secondary ion imaging is used in an ion microscope secondary ion mass spectrometer for the spatially resolved analysis of organic particles on various surfaces. Compared to the use of monoatomic primary ion beam bombardment, the use of a cluster primary ion beam (SF₅⁺ or C₈^-) provides significant improvement in molecular ion yields and a reduction in beam-induced degradation of the analyte molecules. These characteristics of cluster bombardment are utilized, along with automated sample stage control and custom image analysis software, to rapidly characterize the spatial distribution of trace explosive particles, narcotics and inkjet-printed micro arrays on a variety of surfaces.

Citation

Applied Surface Science

Volume

231-232

Issue

Sp.

Pub Type

Journals

Keywords

cluster SIMS, explosives, inkjet, particle searching, polyatomic ion

Citation

Gillen, J. , Zeissler, C. , Mahoney, C. , Lindstrom, A. , Fletcher, R. , Chi, P. , Verkouteren, J. , Bright, D. , Lareau, R. and Boldman, M. (2004), Automated Analysis of Organic Particles Using Cluster SIMS, Applied Surface Science (Accessed October 7, 2025)