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Distribution of Chlorine in Quartz Determined by Neutron Beam Focusing Prompt Gamma Activation Analysis and Micro X-ray Fluorescence

July 1, 2003

Author(s)

Huaiyu H. Chen-Mayer, W J. Heward, Rick L. Paul, F J. Klug, Y Gao

Relative Intensity Correction Standards for Raman Spectroscopy for Excitation with Several Common Laser Wavelengths

July 1, 2003

Author(s)

Steven J. Choquette, Douglas H. Blackburn, E S. Etz, Wilbur S. Hurst

Structure?Function Relationships in High-Density Octadecylsilane Stationary Phases by Raman Spectroscopy. 3. Effects of Self-Associating Solvents

June 6, 2003

Author(s)

C J. Orendorff, M W. Ducey, J E. Pemberton, Lane C. Sander

Structure?Function Relationships in High-Density Octadecylsilane Stationary Phases by Raman Spectroscopy. 4. Effects of Neutral and Basic Aromatic Compounds

June 6, 2003

Author(s)

C J. Orendorff, M W. Ducey, J E. Pemberton, Lane C. Sander

Advances in Optical Methods for Trace Gas Analysis

May 1, 2003

Author(s)

Pamela M. Chu

The fundamental principles for chemical analysis by optical methods are established. However, only recent advances in instrumentation and spectroscopic techniques have substantially expended the feasibility of routine spectroscopic analysis of gaseous

Rare-Earth Glass Reference Materials for Near-Infrared Spectrometry: Correcting and Exploiting Temperature Dependencies

February 15, 2003

Author(s)

Steven J. Choquette, L E. O'Neal, David L. Duewer

Structural Alterations of the Heme Environment of Cytochrome P450cam and the Y96F Mutant as Deduced by Resonance Raman Spectroscopy

January 1, 2003

Author(s)

G Niaura, Vytas Reipa, M P. Mayhew, Marcia J. Holden, V L. Vilker

Resonance Raman spectroscopy at 2.5 cm-1 resolution was used to probe differences in wild type and Y96F mutant P450cam (CYP101), both with and without bound camphor or styrene substrates. In the substrate-free state, the spin state equilibrium is shifted

Preface to Cavity-Enhanced Spectroscopies

December 1, 2002

Author(s)

Roger D. van Zee, J P. Looney

This submission is an introduction to Cavity-Enhanced Spectroscopy, a book which is to be published by Academic Press.

Grazing Incidence X-Ray Photoelectron Spectroscopy: A Method to Study Gate Dielectric Films on Si

November 1, 2002

Author(s)

Terrence J. Jach, E Landree

Grazing Incidence X-ray Photoelectron Spectroscopy (GIXPS) is a method that offers promise as a non-destructive technique to measure the thickness and chemistry of ultrathin gate dielectric films. It combines aspects of x-ray reflectivity and conventional

Structure?Function Relationships in High-Density Octadecylsilane Stationary Phases by Raman Spectroscopy: 2. Effect of Common Mobile-Phase Solvents

October 8, 2002

Author(s)

M W. Ducey, C J. Orendorff, J E. Pemberton, Lane C. Sander

Threshold Resonance Spectroscopy: A Key to Cold Collision Physics

September 1, 2002

Author(s)

Paul S. Julienne

Threshold scattering resonances play a crucial role in cold collision physics and cold molecule formation from cold atoms. We describe several examples involving magnetic Feshbach spectroscopy of Cs atoms, photoassociation of Na atoms in a Bose-Einstein

On the Application of Quantitative Cavity Ring Down Spectroscopy to Measruements of Line Shapes and Continuum Absorption

June 7, 2002

Author(s)

J G. Cormier, Joseph T. Hodges, J R. Drummond

Cavity ringdown spectroscopy (CRDS) is a highly sensitive spectroscopic technique that has been successfully applied to problems such as trace gas detection and the observation of weak spectra. Despite possessing several intrinsic advantages over other

Synchrotron White-Beam X-Ray Topography of Ribonuclease S Crystals

April 1, 2002

Author(s)

W M. Vetter, David Travis Gallagher, M Dudley

With careful experimental design indexed synchrotron white-beam X-ray topographs of ribonuclease S crystals at ambient temperature could be recorded with a definition and contrast comparable to that of monochromatic beam topographs of other proteins

The NIST Electron Effective-Attenuation-Length Database

February 1, 2002

Author(s)

Cedric J. Powell, Aleksander Jablonski

The NIST Electron Effective-Attenuation-Length Database provides values of electron effective attenuation lengths (EALs) in solid elements and compounds at selected electron energies between 50 eV and 2,000 eV. The database was designed mainly to provide

Comparison of Optical Coherence Tomography, X-Ray Computed Tomography, and Confocal Microscopy Results From an Impact Damaged Epoxy/E-Glass Composite

January 1, 2002

Author(s)

Joy Dunkers, D P. Sanders, Donald L. Hunston, M J. Everett, William H. Green

Optical coherence tomography (OCT) is an emerging technique for imaging of synthetic materials. OCT is attractive because of the combination of its high sensitivity (>90 dB), high resolution ((10-20) mm), and low cost ($75 k). The value of any new

Near-Field Vibrational Spectroscopy: Infrared and Raman Studies at High Spatial Resolution

January 1, 2002

Author(s)

Stephan J. Stranick, D B. Chase, Chris A. Michaels

The ability to measure chemical bond changes on the nanometer scale is of critical importance for the characterization of catalytic materials, engineered materials and surfaces relevant to biological problems. In this paper, we will outline the development

Periodic Table: Atomic Properties of the Elements, Version 3

January 1, 2002

Author(s)

Robert A. Dragoset, Arlene Musgrove, Charles W. Clark, William C. Martin

In Situ Raman Spectroscopic Investigation of Zirconium-Niobium Alloy Corrosion Under Hydrothermal Conditions

October 1, 2001

Author(s)

James E. Maslar, Wilbur S. Hurst, Walter J. Bowers Jr., Jay H. Hendricks

In situ Raman spectroscopy was employed to investigate corrosion of a zirconium-niobium alloy in air-saturated water at a pressure of 15.5 MPa and temperatures ranging from 22 to 407 C in an optically accessible flow cell. Monoclinic ZrO 2 (m-ZrO 2) was

Summary of the American Society for Testing and Materials Practice E 2108-00 for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer

October 1, 2001

Author(s)

Cedric J. Powell

A short summary is given of the new ASTM practice E 2108-00 for the calibration of the binding-energy scales of X-ray photoelectron spectrometers.

X-ray and Neutron Optics

October 1, 2001

Author(s)

David F. Mildner

Chromium-Doped Luminescent Glasses for Raman Intensity Calibration with 785 nm Laser Excitation

September 1, 2001

Author(s)

E S. Etz, Wilbur S. Hurst, Steven J. Choquette, Douglas H. Blackburn

Influence of Elastic-Electron Scattering on Measurements of Sillicon Dioxide Film Thicknesses by X-Ray Photoelectron Spectroscopy

September 1, 2001

Author(s)

Cedric J. Powell, Aleksander Jablonski

We investigate the systematic error due to neglet of elastic scattering of photoelectrons in measurements of the thicknesses of thin films of SiO 2 on Si by x-ray photoelectron spectroscopy (XPS). Calulations were made of substrate Si 2p photoelectron

Solubilities of Cerium(IV), Terbium(III), and Iron(III) b-Diketonates in Supercritical Carbon Dioxide

September 1, 2001

Author(s)

W C. Andersen, R E. Sievers, A F. Lagalante, Thomas J. Bruno

Comparisons of Calculated and Measured Effective Attenuation Lengths for Silicon Dioxide Over a Wide Electron Energy Range

August 1, 2001

Author(s)

Cedric J. Powell, Aleksander Jablonski

We report calculations of effective attenuation lengths (EALs) for Si 2p photoelectrons in silicon dioxide at photoelectron energies between 82 and 1385 eV. These EALs are compared with measured values reported recently by Shimada et al. [Surf. Interface

Grazing Incidence X-Ray Photoemission Spectroscopy and the Accuracy of Thickness Measurements of CMOS Gate Dielectrics

August 1, 2001

Author(s)

Terrence J. Jach, E Landree

Grazing incidence x-ray photoelectron spectroscopy (GIXPS) is a method that offers promise as a non-destructive technique to measure the thickness and chemical state of ultrathin gate dielectric films. This method utilizes the non-linear dependence of the

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