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Displaying 801 - 825 of 871

Conventional Cells--The Last Step Toward General Acceptance of Standard Conventional Cells for the Reporting of Crystallographic Data

August 1, 2002

Author(s)

Alan D. Mighell

The Absolute Integrating Sphere Method is now used at NIST for the detector-based calibration of total luminous flux of lamps, as well as for the realization of the lumen. This method has many benefits for high-accuracy applications, allowing for

Hierarchical Planning Algorithms

April 5, 2002

Author(s)

Alberto Lacaze

A novel method for communicating commands in hierarchical planning control is presented. This new method can be used to warranty that plans created will be optimal within the defined planning graphs throughout the planning hierarchy. Boundary conditions

Lattice Symmetry and Identification--The Fundamental Role of Reduced Cells in Materials Characterization

February 1, 2002

Author(s)

Alan D. Mighell

In theory, physical crystals can be represented by idealized mathematical lattices. Under appropriate conditions, these representations can be used for a variety of purposes such as identifying, classifying, and understanding the physical properties of

NIST Handbook 150-2C:2001 NVLAP Calibration Laboratories, Technical Guide for Time and Frequency Measurements

September 21, 2001

Author(s)

C D. Faison, Carroll S. Brickenkamp

NIST HANDBOOK 150-2E National Voluntary Laboratory Accreditation Program Calibration Laboratories Technical Guide for Optical Radiation Measurements

August 21, 2001

Author(s)

C D. Faison, Carroll S. Brickenkamp

Proceedings of the Workshop on Measurement Traceability for Clinical Laboratory Testing and In Vitro Diagnostic Test Systems

May 1, 2001

Author(s)

Ellyn S. Beary

In November 2000, NIST hosted a workshop on Measurement Traceability for Clinical Laboratory Testing and In Vitro Diagnostic Devices. One of the driving forces was the new European Community (EC) In Vitro Diagnostic Devices (IVDD) directive that requires

Digital Cinema 2001, Conference Proceedings

December 31, 2000

Author(s)

Charles D. Fenimore, M M. Floyd

This Proceeding provides papers and slides for the presentations at digital Cinema 2001 Conference. The conference addresses a variety of business and technical issues arising in developing digital cinema. Speakers address: on overview of digital cinema

Definitions of Terms and Modes Used at NIST for Value-Assignment of Reference Materials for Chemical Measurement

December 1, 2000

Author(s)

Willie E. May, Reenie M. Parris, C. M. Beck II, John D. Fassett, Robert R. Greenberg, Franklin R. Guenther, Gary W. Kramer, Stephen A. Wise, T.E. Gills, R Gettings, Bruce S. MacDonald

Frequency Dependence of a Cryogenic Capacitor Measured Using Single Electron Tunneling Devices

December 1, 2000

Author(s)

Ali L. Eichenberger, Mark W. Keller, John M. Martinis, Neil M. Zimmerman

A new type of capacitance standrd based on counting electrons has been built. The operation of the standrd has already given very promising results for the determination of the value of a cryogenic vacuum-gap capacitor. The new capacitance standard

Driving Autonomously Offroad up to 35 km/h

October 1, 2000

Author(s)

David Coombs, Karl Murphy, Alberto Lacaze, Steven Legowik

A robotic HMMWV (a.k.a. "humvee") drives autonomously offroad at speeds up to 35 km/h (10 m/s, 20 mph). Key features of the implementation that enable driving at these speeds are (1) planning the next 20 m with dynamically feasible trajectories, and (2)

Useful Lead and Bismuth Standards for Quantitative Electron Probe Microanalysis

August 1, 2000

Author(s)

Ryna B. Marinenko, Eric S. Windsor

This is a preliminary study of lead and bismuth selinides and tellurides to determine the usefullness of these materials as Pb and Bi standards for quantitative microanalysis. Precautions were taken during sample preparation procedures to reduce the

The Challenge of Intelligent Systems

July 19, 2000

Author(s)

A Meystel, Elena R. Messina

This paper analyzes the meaning of intelligence within the domain of intelligent control. Because of historical reasons, there are varying and diverse definitions of what constitutes an intelligent control system. Due to the multidisciplinary nature of

Status of Microanalysis Standards at the National Institute of Standards and Technology (NIST)

July 1, 2000

Author(s)

Ryna B. Marinenko

This is a review of the current status of microanalysis standards at NIST -what is presently available, what will soon be available, and what might be available in the future. Many of the standards issued in the past such as Cartridge Brass (SRM 478), Fe-3

Impact of Measurement and Standards Infrastructure on the National Economy and International Trade

April 1, 2000

Author(s)

Hratch G. Semerjian, Robert L. Watters

The U.S. Federal Government has a strong role in metrology R&D in the U.S because of its importance to the nation's economy and the Constitutional authority given to the National Institute of Standards and Technology (NIST). However, pressures to maintain

Laboratory Primary Standards

April 1, 2000

Author(s)

John D. Wright

Commonly used primary calibration techniques for the measurement of liquid and gas flows are described. The techniques described include: static gravimetric and dynamic gravimetric methods for both gases and liquids, liquid piston displacement provers

Certification of the Relative Molecular Mass and the Intrinsic Viscosity of SRM 2886, a Polyethylene of Narrow Molecular Mass Distribution

March 1, 2000

Author(s)

Kathleen M. Flynn, J R. Maurey, William R. Blair

The certification of a polyethylene standard reference material, SRM 2886, is described. The Mw of SRM 2886 by light scattering was determined to be 87.0x10+3 g/mol with a sample standard deviation of 2.4 x10+3 g/mol. A combined expanded uncertainty for

NIST Handbook 150-21 National Voluntary Laboratory Accreditation Program Chemical Calibration Certifiers of Spectrophotometric NTRMs

February 26, 2000

Author(s)

Gary W. Kramer, John C. Travis, C D. Faison

Definitions of Terms and Modes Used at NIST for Value-Assignment of Reference Materials for Chemical Measurement

January 1, 2000

Author(s)

Willie E. May, Reenie M. Parris, C. M. Beck II, John D. Fassett, Robert R. Greenberg, Franklin R. Guenther, Gary W. Kramer, Stephen A. Wise, T E. Gills, R J. Gettings, Bruce S. MacDonald

Accurate Determination of Trace Elements in Sediment CRMs by Instrumental Neutron Activation Analysis

December 1, 1999

Author(s)

D. A. Becker

A Unique Institution: The History of NBS, 1950-1969

June 30, 1999

Author(s)

E Passaglia, K A. Beal

A follow-on to Measures for Progress by Rexmond C. Cochrane, this work covers the history of the National Bureau of Standards (NBS) from 1950-1969. While the book focuses on technical work, the management and administration of the Bureau are also discussed

Analysis of Urban Particulate Standard Reference Materials for the Determination of Chlorinated Organic Contaminants and Additional Chemical and Physical Properties

February 1, 1999

Author(s)

Dianne L. Poster, Michele M. Schantz, Stephen A. Wise, M. G. Vangel

NIST Calibration Services for Gas Flow Meters: Piston Prover and Bell Prover Gas Flow Facilities

August 1, 1998

Author(s)

John D. Wright, G E. Mattingly

This document provides a description of the small and medium range gas flow calibration facilities at the National Institute of Standards and Technology (NIST), Fluid Flow Group, as reported in NIST Special Publication 250 for Test Nos. 18010C-18040C and

The Role of the National Committee for Clinical Laboratory Standards (NCCLS) and the National Institute of Standards and Technology (NIST) in Voluntary Consensus

July 31, 1998

Author(s)

W Koch

Speech presented to the Japanese Committee for Clinical Laboratory Standards (JCCLS). The National Committee for Clinical Laboratory Standards (NCCLS) and JCCLS are partners and share the common goal of improving the health care of our nations and the

High-Performance Trapped Hg + Frequency Standards

July 6, 1998

Author(s)

D J. Berkeland, James C. Bergquist, Wayne M. Itano, J D. Miller, B C. Young, David J. Wineland

VAMAS Activities for Standardization of Measurement Methods for Superconducting Materials

July 1, 1998

Author(s)

H Wada, Loren F. Goodrich, Kate H. ten

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