Marinenko, R.
and Windsor, E.
(2000),
Useful Lead and Bismuth Standards for Quantitative Electron Probe Microanalysis, Microscopy Society of America; Microscopy and Microanalysis, Annual Meeting | 58th | | Springer, Philadelphia, PA
(Accessed October 8, 2024)
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Useful Lead and Bismuth Standards for Quantitative Electron Probe Microanalysis
Published
Author(s)
,
Abstract
This is a preliminary study of lead and bismuth selinides and tellurides to determine the usefullness of these materials as Pb and Bi standards for quantitative microanalysis. Precautions were taken during sample preparation procedures to reduce the surface oxidation on the specimens, followed directly by electron probe analysis. Results are compared using the pure elements,K456 NIST SRM glass, and PbS as standards.Proceedings Title
Microscopy Society of America; Microscopy and Microanalysis, Annual Meeting | 58th | | Springer
Volume
6
Issue
Suppl. 2
Conference Dates
August 1, 2000
Conference Location
Philadelphia, PA
Conference Title
Microscopy and Microanalysis Society Annual Meeting
Pub Type
Conferences
Keywords
bismuth standards, lead standards, microanalysis standards, quantitative electron probe microanalysi, standards for microanalysis
Citation
Issues
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Created August 1, 2000, Updated February 19, 2017