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Displaying 58251 - 58275 of 74517

A Bibliography on Apparel Sizing and Related Issues

January 1, 1994
Author(s)
Yung-Tsun T. Lee
Anthropometric data and sizing systems is an important component of apparel quality. Apparel can not be top quality unless it fits the potential wearers satisfactorily. Much research has been conducted on this topic area. Some of these research results are

A Calibrated Atomic Force Microscope

January 1, 1994
Author(s)
T Mcwaid, J Schneir
Atomic force microscope (AFM) is a rapidly emerging measurement technology. As the technology develops, it is being incorporated into industrial research and development, and manufacturing facilities. At present there are no sub-micrometer pitch or sub-ten

A Dimensional Inspection Planning Activity Model

January 1, 1994
Author(s)
Shaw C. Feng
This paper describes an activity model for dimensional inspection planning that bridges the gap between product design and the dimensional measurement of manufactured products. Functionally, this model specifies requirements for developing a part of a

A High Accuracy Micrometer for Diameter Measurements of Cylindrical Standards

January 1, 1994
Author(s)
John R. Stoup, Theodore D. Doiron
NIST has developed a new instrument to measure cylindrical standards including thread wires and plain plug gages. The instrument uses a laser interferometer system which is coupled with an air bearing linear motion slide and precise contact geometry to

A New Method to Measure the Distance Between Graduation Lines on Graduated Scales

January 1, 1994
Author(s)
William B. Penzes, Robert Allen, Michael W. Cresswell, L Linholm, E C. Teague
Line scales are used throughout industry for a variety of applications. The most common is the stage micrometer, a small graduated glass scale for the calibration of optical instruments such as microscopes. However, stage micrometers are generally not
Displaying 58251 - 58275 of 74517
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