U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

A Calibrated Atomic Force Microscope

Published

Author(s)

T Mcwaid, J Schneir

Abstract

Atomic force microscope (AFM) is a rapidly emerging measurement technology. As the technology develops, it is being incorporated into industrial research and development, and manufacturing facilities. At present there are no sub-micrometer pitch or sub-ten nanometer height standards suitable for calibrating AFMs. University- and industry-based researchers are developing suitable calibration artifacts. We are developing an AFM capable of calibrating these artifacts.
Proceedings Title
Program of 1st Industrial Applications of Scanned Probe Microscopy; NIST
Conference Location
, USA
Conference Title
Gaithersburg (MD)
Pub Type
Conferences
Metrology and Manufacturing

Citation

Mcwaid, T. and Schneir, J. (1994), A Calibrated Atomic Force Microscope, Program of 1st Industrial Applications of Scanned Probe Microscopy; NIST, , USA (Accessed December 7, 2023)

Created December 31, 1993, Updated October 12, 2021