TY  - CONF
AU  - T Mcwaid
AU  - J Schneir
C2  - Program of 1st Industrial Applications of Scanned Probe Microscopy; NIST, , USA
DA  - 1994-01-01 00:01:00
LA  - en
PB  - Program of 1st Industrial Applications of Scanned Probe Microscopy; NIST, , USA
PY  - 1994
TI  - A Calibrated Atomic Force Microscope
ER  -