@conference{774436,
  author = {T Mcwaid and J Schneir},
  title = {A Calibrated Atomic Force Microscope},
  year = {1994},
  month = {1994-01-01 00:01:00},
  publisher = {Program of 1st Industrial Applications of Scanned Probe Microscopy; NIST, , USA},
  language = {en},
}