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Displaying 56876 - 56900 of 74219

Automated Calibration of Scanning Probe Microscopy by Image Processing

January 1, 1995
Author(s)
J Jorgensen
The continuing drive within high technology industries to push dimensional tolerances to still smaller values motivates the use of surface measuring techniques with better resolution. This requirement can be met by the scanning probe microscopy (SPM)

Automated Manufacturability Analysis: A Survey

January 1, 1995
Author(s)
William Regli
In the marketplace of the 21st century, there is no place for traditional over-the-wall'', communications between design and manufacturing. In order to design it right the very first time, designers must ensure that their products are both functional and
Displaying 56876 - 56900 of 74219
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