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Displaying 56326 - 56350 of 74512

Novel Methods for Length Measurement Employing Diode Lasers

January 1, 1996
Author(s)
Jack A. Stone Jr., Lowell P. Howard, Alois Stejskal, M Stephens, C Oates, L Hollberg
Diode lasers have several unique capabilities for length-measurement applications, arising from properties of the diodes that are much different from those of the venerable helium-neon laser presently used for most interferometric measurements. For example

On chip morphology, tool wear and cutting mechanics in finish hard turning.

January 1, 1996
Author(s)
Matthew A. Davies, Christopher J. Evans, Y K. Chou
Topography of surfaces produced in finish hard turning using cubic boron nitride (CBN) is affected by a large number of factors including tool wear and the mechanics of the chip formation process. This paper shows first that tool wear rates are affected by

Optical Overlay Metrology at NIST

January 1, 1996
Author(s)
Richard M. Silver, Amy Singer, L Carroll, S Berg-cross, James E. Potzick
Many of the significant challenges in making accurate overlay registration measurements are discussed. An understanding of the causes of the errors affecting these measurements is a prerequisite to improving accuracy and also for the design of standard
Displaying 56326 - 56350 of 74512
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