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Displaying 56051 - 56075 of 74175

Progress Towards Accurate Metrology Using Atomic Force Microscopy

January 1, 1996
Author(s)
T Mcwaid, J Schneir, John S. Villarrubia, Ronald G. Dixson, V W. Tsai
Accurate metrology using atomic force microscopy (AFM) requires accurate control of the tip position, an estimate of the tip geometry, and an understanding of the tip-surface interaction forces. We describe recent progress at NIST towards accurate AFM

Proposed IEEE-P1451.3 Mixed-mode Smart Transducer Interface

January 1, 1996
Author(s)
S Chen, Kang B. Lee
Various transducer companies offer proprietary smart transducers and interfaces as upgrades or improvements. Such upgrades ease installation, perform self-test, reduce errors, improve the quality of measurements, and reduce cost. However, without a

Rapid Discharge of a Fire Suppressing Agent

January 1, 1996
Author(s)
Jiann C. Yang, William M. Pitts, B D. Breuel, William L. Grosshandler, W G. Cleveland
This paper describes an experimental method to study the rapid discharge of a fire suppressant (C3F8) from a pressurized vessel. Experimental observations inside and at the exit of the vessel were made using high-speed photography. Boiling was not observed
Displaying 56051 - 56075 of 74175
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