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Characterizing Surfaces and Overlying Multilayer Structures Using Grazing Incidence X-Ray Reflectivity

Published

Author(s)

J Pedulla, R Deslattes, K D. Joensen, P Gorenstein
Citation
Materials Research Society Symposium Proc - Polycrystalline Thin Films II Symposium I
Volume
403

Citation

Pedulla, J. , Deslattes, R. , Joensen, K. and Gorenstein, P. (1996), Characterizing Surfaces and Overlying Multilayer Structures Using Grazing Incidence X-Ray Reflectivity, Materials Research Society Symposium Proc - Polycrystalline Thin Films II Symposium I (Accessed July 15, 2024)

Issues

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Created January 1, 1996, Updated February 17, 2017