Pedulla, J.
, Deslattes, R.
, Joensen, K.
and Gorenstein, P.
(1996),
Characterizing Surfaces and Overlying Multilayer Structures Using Grazing Incidence X-Ray Reflectivity, Materials Research Society Symposium Proc - Polycrystalline Thin Films II Symposium I
(Accessed July 27, 2024)
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Characterizing Surfaces and Overlying Multilayer Structures Using Grazing Incidence X-Ray Reflectivity
Published
Author(s)
, , K D. Joensen, P Gorenstein
Citation
Materials Research Society Symposium Proc - Polycrystalline Thin Films II Symposium I
Volume
403
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1996, Updated February 17, 2017