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Characterization of Metallic Thin Film Growth by STM

Published

Author(s)

Angela Davies, Joseph A. Stroscio, Daniel T. Pierce, John Unguris, Mark D. Stiles, Robert Celotta
Proceedings Title
Proceedings of the NIST Interagency Reports 5752
Conference Dates
May 3-4, 1995
Conference Location
Gaithersburg, MD, US
Conference Title
Workshop on Industrial Applications of Scanned Probe Microscopy

Keywords

MICROSCOPY

Citation

Davies, A. , Stroscio, J. , Pierce, D. , Unguris, J. , Stiles, M. and Celotta, R. (1996), Characterization of Metallic Thin Film Growth by STM, Proceedings of the NIST Interagency Reports 5752, Gaithersburg, MD, US (Accessed February 24, 2024)
Created December 31, 1995, Updated October 12, 2021