TY  - CONF
AU  - Angela Davies
AU  - Joseph Stroscio
AU  - Daniel Pierce
AU  - John Unguris
AU  - Mark Stiles
AU  - Robert Celotta
C2  - Proceedings of the NIST Interagency Reports 5752, Gaithersburg, MD, US
DA  - 1996-01-01 00:01:00
LA  - en
PB  - Proceedings of the NIST Interagency Reports 5752, Gaithersburg, MD, US
PY  - 1996
TI  - Characterization of Metallic Thin Film Growth by STM
ER  -