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Displaying 53551 - 53575 of 73697

Logic Based Design Modeling with Shape Algebras

September 1, 1997
Author(s)
Scott Chase
A new method of describing designs by combining the paradigms of shape aglebras and predicate logic representations is presented. Representing shapes and spatial relations in logic provides a natural, intuitive mehtod of developing complete computer

Microwave Dielectric Characterization of Bulk Ferroelectrics

September 1, 1997
Author(s)
Claude Weil, Richard G. Geyer, L. Sengupta
We discuss the application of existing RF measurement techniques, including waveguide and mode-filtered cavity resonator methods, to the dielectric characterization of bulk high permitivity ferroelectrics at microwave frequencies.

Modulation of the Charge of a Single-Electron Transistor by Distant Defects

September 1, 1997
Author(s)
Neil M. Zimmerman, J. L. Cobb, Alan F. Clark
We have systematically measured two-level fluctuator [TLF] noise in a single-electron tunneling transistor. From the amplitude, duty cycle, and presence of intermediate states, we conclude that there is a cluster of triggered TLF's in this case. The

Optimizing the NIST Magnetic Imaging Reference Sample

September 1, 1997
Author(s)
Paul Rice, Stephen E. Russek, J Hoinville, Michael H. Kelley
We have further developed the NIST magnetic imaging reference sample to include a magnetic pattern which can indicate the magnetic polarity of a magnetic force microscope tip. Several samples cut from the same disk were measured with a single tip. We have

Overview for Special Issue of Standard View

September 1, 1997
Author(s)
S A. Wakid, Shirley M. Radack
This article introduces a Special Issue of StandardView, in which some of the critical measurement issues that challenge the information technology community are explored. A series of papers are presented in the Special Issue to look at some of the first

Requirements for Modeling Manufacturing Process: A New Perspective

September 1, 1997
Author(s)
Craig I. Schlenoff, Amy Knutilla, Steven R. Ray
A wide range of applications deal with the manipulation and expression of collections of activities. Each of these applications serves a specific audience and need, and focuses on particular aspects of a process. Nevertheless, much could be gained by

Rotating-polarizer polarimeter for accurate retardance measurement

September 1, 1997
Author(s)
Paul A. Williams, Allen Rose, Chih-Ming Wang
We demonstrate an automated polarimeter based on a rotating polarizer for the measurement oflinear retardance independent oflaser power and detector gain. The retardance is found when a curve is fitted to a unique normalization of the intensity response of
Displaying 53551 - 53575 of 73697
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