Ehrlich, C.
and Rasberry, S.
(1998),
Metrological Timelines in Traceability, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed September 16, 2024)
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Metrological Timelines in Traceability
Published
Author(s)
, S D. Rasberry
Citation
Journal of Research (NIST JRES) -
Volume
103 No. 1
NIST Pub Series
Pub Type
NIST Pubs
Keywords
calibration, measurement assurance, measurement comparisons, measurement uncertainty, metrology, timelines, traceability
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1998, Updated February 17, 2017