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Metrological Timelines in Traceability

Published

Author(s)

Charles D. Ehrlich, S D. Rasberry
Citation
Journal of Research (NIST JRES) -
Volume
103 No. 1

Keywords

calibration, measurement assurance, measurement comparisons, measurement uncertainty, metrology, timelines, traceability

Citation

Ehrlich, C. and Rasberry, S. (1998), Metrological Timelines in Traceability, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed May 27, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 1998, Updated February 17, 2017