Ehrlich, C.
and Rasberry, S.
(1998),
Metrological Timelines in Traceability, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed January 20, 2026)
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Metrological Timelines in Traceability
Published
Author(s)
, S D. Rasberry
Citation
Journal of Research (NIST JRES) -
Volume
103 No. 1
NIST Pub Series
Pub Type
NIST Pubs
Keywords
calibration, measurement assurance, measurement comparisons, measurement uncertainty, metrology, timelines, traceability
Citation
Issues
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Created January 1, 1998, Updated February 17, 2017