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Displaying 53201 - 53225 of 73697

Development of Environmental Scanning Electron Microscopy Electron Beam Profile Imaging with Self-Assembled Monolayers and Secondary Ion Mass Spectroscopy

December 1, 1997

Author(s)

Scott A. Wight, G Gillen, T M. Herne

Discrepancies in Turbidity Measurements in the Ionic Binary Mixture Triethyl n-Hexyl Ammonium Triethyl Boride in Diphenyl Ether

December 1, 1997

Author(s)

S. Wiegand, Jan V. Sengers, M E. Briggs, R W. Gammon

Dissolution of Zirconium in Nitric-Hydrofluoric Acid Mixtures

December 1, 1997

Author(s)

R Klein

DNA Molecules as Standard Reference Materials I: Development of DNA Identification Sequences and Human Mitochondrial DNA Reference Sequences

December 1, 1997

Author(s)

K H. McKenney, J Hoskins, J Tian, P Reddy

Dynamic Model of the RF-Powered Sheath in Highly Asymmetric RF Discharges

December 1, 1997

Author(s)

Mark A. Sobolewski

Dynamic Modeling and Optimization of Microhotplate Chemical Gas Sensors,

December 1, 1997

Author(s)

T A. Kunt, T. J. McAvoy, Richard E. Cavicchi, Stephen Semancik

Dynamical Systems Approach to Particle Transport Modeling in Dilute Gas-Particle Flows with Application to a Chemical Vapor Deposition Reactor

December 1, 1997

Author(s)

T J. Burns, R W. Davis, Elizabeth F. Moore

Dynamics and Free Energy of Polymers Partitioning into a Nanoscale Pore

December 1, 1997

Author(s)

S. M. Bezrukov, I Vodyanoy, R A. Brutyan, J. J. Kasianowicz

EEEL 1997 Technical Accomplishments/Advancing Metrology for Electrotechnology to Support U.S. Economy

December 1, 1997

Author(s)

JoAnne M. Surette

The Electronics and Electrical Engineering Laboratory (EEEL), working in concert with other NIST Laboratories, is providing measurement and other generic technology critical to the competitiveness of the U.S. electronics industry and the U.S. electrical

Effect of Ge on the Segregation of B in Si(100) and Si(110)

December 1, 1997

Author(s)

P E. Thompson, C Silvestre, G Jernigan, K D. Hobart, David S. Simons, M Gregg

Effect of Oxygen-Enriched Atomization Air on the Characteristics of Spray Flames

December 1, 1997

Author(s)

Ashwani K. Gupta, T Damm, C Cook, S R. Charagundla, Cary Presser

Effect of Shape and Orientation on the Performance of Supercritical Water Oxidation

December 1, 1997

Author(s)

A. M. Lee

Effects of Different Methods of Preparation of Ice Mantles of Triple Point of Water Cells on the Temporal Behavior of the Triple-Point Temperatures

December 1, 1997

Author(s)

G T. Furukawa, Billy W. Mangum, Gregory F. Strouse

Electron Probe Microanalyzer

December 1, 1997

Author(s)

Dale E. Newbury

Electron-Beam Damaged High-Temperature Superconductor Josephson Junctions

December 1, 1997

Author(s)

A. J. Pauza, W. E. Booij, K. Herrmann, D. F. Moore, M. G. Blamire, David A. Rudman, Leila R. Vale

Electronic Structure of the BF2 Radical Determined by ab initio Calculations and Resonance Enhanced Multiphoton Ionization Spectroscopy

December 1, 1997

Author(s)

D B. Atkinson, Karl Irikura, Jeffrey W. Hudgens

Electronics and Electrical Engineering Laboratory Technical Progress Bulletin Covering Laboratory Programs, July to September, 1997, with 1997-1998 Events Calendar

December 1, 1997

Author(s)

J M. Rohrbaugh

This is the fifty-ninth issue of a quarterly publication providing information on the technical work of the National Institute of Standards and Technology, Electronics and Electrical Engineering Laboratory. This issue of the EEEL Technical Progress