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Displaying 52801 - 52825 of 73893

Ferromagnetic Resonance Linewidth in Thin Films Coupled to NiO

January 1, 1998
Author(s)
Robert McMichael, Mark D. Stiles, P J. Chen, William F. Egelhoff Jr.
The out-of-plane angular dependence of the ferromagnetic resonance linewidth, Δ H is described by nearly angle-independent damping parameters. In the NiO-coupled films, however, the damping was found to depend strongly on magnetization orientation, with

Ferromagnetic Resonance Studies of NiO-coupled Thin Films of Ni 80 Fe 20

January 1, 1998
Author(s)
Robert McMichael, Mark D. Stiles, P J. Chen, William F. Egelhoff Jr.
This paper describes ferromagnetic resonance (FMR) and magnetoresistive measurements of thin magnetic films coupled to antiferromagnetic films. First, FMR results for films of Ni 80Fe^d20 show that coupling to NiO produces the angular variation in the
Displaying 52801 - 52825 of 73893
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