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Displaying 51426 - 51450 of 74024

Optical constants of (Al 0.98 Ga 0.02 ) x O y native oxides

December 14, 1998
Author(s)
K. J. Knopp, Richard Mirin, David H. Christensen, Kristine A. Bertness, Alexana Roshko, R A. Synowicki
We report the optical constants of oxidized crystalline and low-temperature-grown (LTG) Al 0.98Ga 0.02As films, as determined by variable angle spectroscopic ellipsometry. Data were acquired at three angles of incidence over 240-1700nm and fit to a Cauchy

Parallel Implementation of a Molecular Dynamics Simulation Program

December 13, 1998
Author(s)
Alan Mink, C A. Bailly
We have taken a NIST molecular dynamics simulation program (md3), which was configured as a single sequential process running on a CRAY C90 vector supercomputer, and parallelized it to run in a distributed memory message passing environment. Since

Report on the First-Generation NIST Convective Heat Flux Calibration Facility

December 10, 1998
Author(s)
David G. Holmberg, C A. Womeldorf
The National Institute of Standards and Technology has developed a convective heat flux calbration facility to allow evaluation of heat flux sensors. This facility is a small wind tunnel that produces a two-dimensionl laminar boundary layer across a heated

Active Multimedia Documents for Mobile Services

December 7, 1998
Author(s)
O E. Kia
Multimedia content is designed for many purposes and the services that are associated with them rely heavily on technologies that address representation, processing, and transmission of that content. This paper presents a new model that refines the

Performance Measurement Using Low Perturbation and High Precision Hardware Assists

December 3, 1998
Author(s)
Alan Mink, Wayne J. Salamon, J Hollingsworth, R Arunachalam
We present the design and implementation of MultiKron PCI, a hardware performance monitor that can be plugged into any computer with a free PCI bus slot. The monitor provides a series of high-resolution timers, and the ability to monitor the utilization of

Testing of Interaction-driven Manufacturing Systems

December 2, 1998
Author(s)
Katherine C. Morris, David W. Flater, Donald E. Libes, Albert W. Jones
As automation of manufacturing processes becomes more widespread, manufacturing systems are becoming more and more software dependent. At the same time, the software used is becoming more and more modularized allowing for the creation of customized systems

A Framework for Component-based CNC Machines

December 1, 1998
Author(s)
John L. Michaloski, S Birla, G Weinert, C J. Yen
Open architecture technology is ushering in new advances in the world of computer numerically controlled (CNC) machines. Yet, some major benefits of open architecture technology have failed to materialize due to the lack of a standard open architecture

A Free-Fall Determination of the Newtonian Constant of Gravity

December 1, 1998
Author(s)
J P. Schwarz, D S. Robertson, T M. Niebauer, J E. Faller
We report on a recent determination of the Newtonian constant of gravity, G, using a new free fall method. This method uses a freely falling test object to sense the gravitational field of a ring-shaped mass placed alternately above and below the drop

A Phase Field Model of the Impingement of Solidifying Particles

December 1, 1998
Author(s)
James A. Warren, W Carter, R Kobayashi
We propose a model of the impingement of solidifying crystalline particles, the ensuing grain boundary formation, and grain coarsening. This model improves upon previous theoretical descriptions of this phenomenon, in that the model has the proper behavior

A Search for Possible 'Universal-Applications' Gas Mixtures

December 1, 1998
Author(s)
Loucas G. Christophorou, James K. Olthoff, David S. Green
In an effort to respond to the recent concerns over the possible impact of SF 6 on global warming, we have searched for an SF 6 substitute gas that could be used in high voltage equipment instead of pure SF 6, with minimal changes in practice, operation

Accuracy Differences Among Photomask Metrology Tools and Why They Matter

December 1, 1998
Author(s)
James E. Potzick
A variety of different kinds of photomask critical dimensions (CD) metrology tools are available today to help meet current and future metrology challenges. These tools are based on different operating principles, and have different cost, throughput
Displaying 51426 - 51450 of 74024
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