Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 51001 - 51025 of 74189

Comparison of Classical and MALDI-TOF-MS Analysis of a Polystyrene Interlaboratory Sample

January 1, 1999
Author(s)
William R. Blair, B M. Fanconi, R J. Goldschmidt, Charles M. Guttman, William E. Wallace, S Wetzel, David L. VanderHart
Over the past several years, the use of MALDI-TOF-MS for analysis of synthetic polymers has increased significantly. As the number of polymer analyses by MALDI has increased, scrutiny of the MALDI results in comparison to classically derived values for Mw

Comparisons of Control Charts for Autocorrelated Data

January 1, 1999
Author(s)
Nien F. Zhang
Recently, statistical process control (SPC) methodolgies have been developed to accommodate autocorrelated data. A primary method to deal with autocorrelated data is the use of residual charts. Although this methodology has the advantage that it can be

Computer Simulation and Percolation Theory Applied to Concrete.

January 1, 1999
Author(s)
Edward J. Garboczi, Dale P. Bentz
Concrete is a multilength scale composite material. From the nanometer to the millimeter scale, it is a random composite, and a different random composite at each length scale. Percolation processes play a key role in the microstucture of concrete, and

Correlated Photon Based Metrology Without Absolute Standards

January 1, 1999
Author(s)
Alan L. Migdall
Pairs of photons produced two at a time via optical parametric down-conversion have proved to be a useful tool for metrology. The status of three such applications is presented. One common theme through each of these applications is that they offer

Design and Development of a Dictionary Translator

January 1, 1999
Author(s)
John V. Messina, James A. St Pierre, Michael R. McCaleb
The lack of a traceable set of terminologies to describe electronic components has long been identified by the electronic industry as a significant problem. As part of its Electronic Commerce of Component Information (ECCI) project, NIST's Electronic
Displaying 51001 - 51025 of 74189
Was this page helpful?