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Correlated Photon Based Metrology Without Absolute Standards

Published

Author(s)

Alan L. Migdall

Abstract

Pairs of photons produced two at a time via optical parametric down-conversion have proved to be a useful tool for metrology. The status of three such applications is presented. One common theme through each of these applications is that they offer absolute results without any externally calibrated standards.
Citation
Physics Today

Keywords

correlated photon, down-conversion, metrology, polarization mode dispersion, quantum efficiency, radiance

Citation

Migdall, A. (1999), Correlated Photon Based Metrology Without Absolute Standards, Physics Today, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=841318 (Accessed November 30, 2021)
Created January 1, 1999, Updated February 17, 2017