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Correlated Photon Based Metrology Without Absolute Standards



Alan L. Migdall


Pairs of photons produced two at a time via optical parametric down-conversion have proved to be a useful tool for metrology. The status of three such applications is presented. One common theme through each of these applications is that they offer absolute results without any externally calibrated standards.
Physics Today


correlated photon, down-conversion, metrology, polarization mode dispersion, quantum efficiency, radiance


Migdall, A. (1999), Correlated Photon Based Metrology Without Absolute Standards, Physics Today, [online], (Accessed April 22, 2024)
Created January 1, 1999, Updated February 17, 2017