Migdall, A.
(1999),
Correlated Photon Based Metrology Without Absolute Standards, Physics Today, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=841318
(Accessed December 12, 2024)
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Correlated Photon Based Metrology Without Absolute Standards
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Abstract
Pairs of photons produced two at a time via optical parametric down-conversion have proved to be a useful tool for metrology. The status of three such applications is presented. One common theme through each of these applications is that they offer absolute results without any externally calibrated standards.Citation
Physics Today
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Journals
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Keywords
correlated photon, down-conversion, metrology, polarization mode dispersion, quantum efficiency, radiance
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Created January 1, 1999, Updated February 17, 2017