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NIST Authors in Bold

Displaying 50701 - 50725 of 73697

Magnetic Reversal on Vicinal Surfaces

January 1, 1999
Author(s)
R Hyman, A Zangwill, Mark D. Stiles
We present a theoretical study of in-plane magnetization reversal for vicinal ultrathin films using a one-dimensional micromagnetic model with nearest-neighbor exchange, fourfold anisotropy at all sites, and two-fold anisotropy at step edges. A detailed

Magneto-Optical Measurements of Co-Pt (111) Multilayers

January 1, 1999
Author(s)
R A. Fry, Lawrence H. Bennett, Edward Della Torre, Robert D. Shull, William F. Egelhoff Jr., R F. Farrow, C H. Lee
An automated magneto-optical Kerr effect (MOKE) magnetometer was used to measure the polar Kerr rotation and ellipticity loops of multilayers with X = 0.3 nm to 1.2 nm. For most of the samples studies, the hysteresis loops exhibit typical perpendicular

Manufacturer's CORBA Interface Testing Toolkit: Overview

January 1, 1999
Author(s)
David W. Flater
The Manufacturer's CORBA Interface Testing Toolkit (MCITT)is a software package that supports testing of CORBA components and interfaces. It simplifies the testing of complex distributed systems by producing dummie components from Interface Testing

Materials Reliability 1998 Programs and Accomplishments

January 1, 1999
Author(s)
H I. McHenry, Thomas A. Siewert
The Materials Reliability Division develops measurement technologies which enable the producers and users of materials to improve the quality and reliability of their products. Measurement technologies are developed for process control to improve the

Mean-Field Theories, Their Weaknesses and Strength

January 1, 1999
Author(s)
Johanna Levelt Sengers
Within a historical context, an evaluation of mean-field theory is given in its application to fluids and fluid mixtures. The way mean-field equations such as the Van der Waals equation incorporate molecular attraction and repulsion implies neglect of

Measurement of the 100 nm NIST SRM 1963 by Differential Mobility Analysis

January 1, 1999
Author(s)
George W. Mulholland, Nelson P. Bryner, C M. Croarkin
The number mean diameter of 100 nm NTST Standard Reference Material (SRM) 1963 was measured to be 100.7 nm with an expanded uncertainty at the 95% confidence level of 1.0 nm by measurement with the differential mobility analyzer (DMA). The low level of

Measurement of the Response of a Gallium Metal Solar Neutrino Experiment to Neutrinos from a 51 Cr Neutrino Source

January 1, 1999
Author(s)
J N. Abdurashitov, V N. Gavrin, S V. Girin, V V. Gorbachev, T V. Ibragimova, A V. Kalikhov, N G. Khairnasov, T V. Knodel, V N. Kornoukhov, I N. Mirmov, A A. Shikhin, E P. Verentenkin, V M. Vermul, V E. Yants, G T. Zatsepin, Yu S. Khomyakov, A V. Zvonarev, T J. Bowles, Jeffrey S. Nico, W A. Teasdale, D L. Wark, M L. Cherry, V N. Karaulov, V L. Levitin, P I. Maev, P I. Nazarenko, V S. Shkol'nik, N V. Skorikov, B T. Cleveland, T Daily, R. Davis, K Lande, C K. Lee, P S. Wildenhain, S R. Elliott, J F. Wilkerson

Measurement Uncertainty and Noise in Nanometrology

January 1, 1999
Author(s)
James E. Potzick
The measurement of feature sizes on integrated circuit photomasks and wafers is an economically important and technically challenging application of nanometrology. The displacement measuring laser heterodyne interferometer is a popular tool in such

Measurement Uncertainty and Uncorrected Bias

January 1, 1999
Author(s)
Steven D. Phillips, K Eberhardt, William T. Estler
This paper discusses the distinction between measurement uncertainty, measurement errors and their role in the calibration process. The issue of including uncorrected bias is addressed and a method to extend the current ISO Guide to the Expression of

Measuring the Geometric Errors of a Hexapod Machine Tool

January 1, 1999
Author(s)
Johannes A. Soons
This paper describes procedures to measure the geometric errors of parallel kinematic machines with a Gough configuration. The procedures are applied to estimate and compensate the errors of a prototype hexapod milling machine.
Displaying 50701 - 50725 of 73697
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