January 1, 2000
Author(s)
J A. Gupta, S P. Watkins, E D. Crozier, Joseph Woicik, D A. Harrison, D Jiang, I J. Pickering, B A. Karlin
X-ray diffraction (XRD), X-ray standing wave (XSW) and X-ray absorption fine structure (XAFS) measurements were used to assess the layer perfection and positions of 1 and 2 monolayer (ML) InAs quantum wells buried in GaAs(001). Photoluminescence (PL)