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Displaying 49051 - 49075 of 73779
A. M. Rohaly, P. Corriveau, John M. Libert, A. Webster, V. Baroncini, J. Beerends, J. L. Blin, L. Contin, T. Hamada, Diane Harrison, A. Hekstra, Jack Lubin, Y. Nishida, R. Ishihara, J Pearson, A. F. Pessoa, N. Pickford, A. Schertz, M. Visca, A. B. Watson, S. Winkler
Subjective assessment methods have been used reliably for many years to evaluate video quality. They continue to provide the most reliable assessments compared to objective methods. Some issues that arise with subjective assessment include the cost of
P. Corriveau, A. Webster, A. M. Rohaly, John M. Libert
Subjective assessment methods have been used reliably for many years to evaluate video quality. They continue to provide the most reliable assessments compared to objective methods. Some issues that arise with subjective assessment include the cost of
S H. Southworth, L Young, E P. Kanter, Thomas W. LeBrun
Fundamental understanding of x-ray interactions with atoms and molecules provides a basis for applying x-ray methods to complex materials, such as structural determinations by x-ray diffraction and extended x-ray absorption fine structure. Compton
The Multi-Bridge method is often used in the industry to measure electrical linewidths of interconnect lines because it requires less sensitive equipment than the standard Cross-Bridge method. The method assumes that the linewidth process bias is
C Weber, Ronald H. Ono, James Booth, Leila R. Vale, Samuel Benz, A. M. Klushin, H. Kohlstedt, C. Buchal, R. Semerad
We have investigated both conventional and meandering coplanar microwave transmission lines patterned in Y-Ba-Cu-O/Au bilayers on yttria-stablized zirconia and sapphire substrates. Within the meandering waveguides, the gentre conductor was deformed from a
A. R. Kumar, Nien F. Zhang, V. A. Boychev, D. B. Tanner, Leila R. Vale, David A. Rudman
The transmittance and reflectance of superconductive YBa 2Cu 3O 7-γ (YBCO) thin films deposited on Si substrates have been measured in the far-infrared frequency region from 10 to 100 cmu-1^ (wavelength from 1000 to 100 micro υ) at temperatures between 10
R. W. Romani, Aaron J. Miller, B. Cabrera, Enectali Figueroa-Feliciano, Sae Woo Nam
We report on the first astronomical observations with a photon-counting pixel detector that provides arrival time ((delta)R, less then or equal to} 0.15 eV) resolved measurements from the near-IR through the near UV. Our test Observations were performed by
NIST 36 is a collection of interconnect reliability test structures designed by NIST in collaboration with members of JEDEC Committee JC14.2 on Wafer Level Reliability and with industry researchers. It is a vehicle for improving existing reliability
Leila R. Vale, Ronald H. Ono, Donald G. McDonald, Robert J. Phelan
We have developed YBa 2Cu 3O 7-x (YBCO) thermometers for large-area (4 mm x 4 mm) electrical substitution bolometers. We passivated the YBCO with a thin Au layer and demonstrated a noise equivalent temperature of 4 nK Hz -1/2. We then used a resistor layer
The spontaneous growth of one-dimensional structures during reaction of Mg on GaAs(001) 4x2 Ga-stabilized surface was observed by in situ electron diffraction and ex situ atomic force microscopy (AFM). Reaction led to growth of an epitaxial, cubic phase
This article summarizes the 1999 NIST Speaker Recognition Evaluation. It discusses the overall research objectives, the three task definitions, the development and evaluation data sets, the specified performance measures and their manner of presentation
Combining the power of the Internet with state-of-the-art newly emerging international multimedia standards from the International Telecommunications Union (ITU) provides a platform on which to build a next-generation, real-time collaborative metrology
This database fully reproduces the tables of NIST Monograph 175, Temperature-Electromotive ForceReference Functions and Tables for the Letter-Designated Thermocouple Types Based on the ITS-90, by Burns, Scroger, Strouse, Croarkin, and Guthrie.These