NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 48676 - 48700 of 73697

Networking of Welding Applications: A Tutorial - Knowing the Basics Behind Network Technology Will Help Users of Welding Equipment Identify Where Networks May Be Most Beneficial

January 1, 2000
Author(s)
William G. Rippey, James D. Gilsinn, L Flitter
This article describes the basics of network technology and how networks are being applied to commercial welding applications. The goal is to help non-computer-expert weld technology users to decide where products that use networks may be beneficial, and

New Developments in Deep Ultraviolet Laser Metrology for Photolithography

January 1, 2000
Author(s)
Marla L. Dowell, Christopher L. Cromer, Richard D. Jones, Darryl A. Keenan, Thomas Scott
Current and future laser measurement services at 157, 193, and 248 nm will be reviewed. Laser power and energy measurements at 193 nm will be presented, electrical calibration issues will be reviewed. We report an overall calibration uncertainty of laser

New Limit on the D Coefficient in Polarized Neutron Decay

January 1, 2000
Author(s)
L Lising, S R. Hwang, J M. Adams, T J. Bowles, M C. Browne, T E. Chupp, K A. Coulterpark, Maynard S. Dewey, S J. Freedman, B K. Fujikawa, A Garcia, G L. Greene, G L. Jones, Hans P. Mumm, Jeffrey S. Nico, J M. Richardson, R G. Robertson, W A. Teasdale, Alan K. Thompson, E G. Wasserman, Fred E. Wietfeldt, R C. Welsh, J F. Wilkerson

NIST artifact standards for fiber optic metrology

January 1, 2000
Author(s)
Paul A. Williams
The primary means of transferring fiber optic calibration metrology at the National Institute of Standards and Technology is through artifact standards called Standard Reference Materials (SRM). NIST currently provides SRMs for fiber geometry (fiber

NIST Atomic Spectra Database

January 1, 2000
Author(s)
Yuri Ralchenko, Jeffrey R. Fuhr, F -. Jou, Alexander Kramida, William C. Martin, Larissa Podobedova, Joseph Reader, Edward B. Saloman, Jean E. Sansonetti, Wolfgang L. Wiese

NIST Random Profile Roughness Specimens and Standard Bullets

January 1, 2000
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Robert A. Clary, Michael L. McGlauflin, Eric P. Whitenton, Christopher J. Evans
Based on the numerical controlled (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two prototype standard bullets were developed at the National Institute of Standards and Technology (NIST). These standard

NIST Random Profile Roughness Specimens and Standard Bullets

January 1, 2000
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Christopher J. Evans, Michael L. McGlauflin, Eric P. Whitenton, Robert A. Clary
Based on the numerical controlled (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two prototype standard bullets were developed at the National Institute of Standards and Technology (NIST). These standard

NIST Smart Space: Pervasive Computing Initiative

January 1, 2000
Author(s)
Lynne S. Rosenthal, Vincent M. Stanford
The next great computing paradigm shift, to pervasive computing, is already well under way and will have no less of an impact on industry, government, and daily life than the personal computing revolution. Pervasive computing refers to the emerging trend
Displaying 48676 - 48700 of 73697
Was this page helpful?