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NIST Authors in Bold

Displaying 48426 - 48450 of 73697

Decoherence of Quantum Superpositions Through Coupling to Engineering Reservoirs

January 1, 2000
Author(s)
C J. Myatt, B E. King, Q A. Turchette, C A. Sackett, D Kielpinski, Wayne M. Itano, W M. Monroe, David J. Wineland
The theory of quantum mechanics applies to closed systems. In such ideal situations, a single atom can, for example, exist simultaneously in a superposition of two different spatial locations. In contrast, real systems always interact with their

Definitions of Terms and Modes Used at NIST for Value-Assignment of Reference Materials for Chemical Measurements

January 1, 2000
Author(s)
Willie E. May, Reenie M. Parris, C M. Beck, John D. Fassett, Robert R. Greenberg, Franklin R. Guenther, Gary W. Kramer, Stephen Wise, T E. Gills, Jennifer C. Colbert, R J. Gettings, Bruce S. MacDonald
Standard Reference Materials (SRMs) are certified reference materials (CRMs) issued by NIST that are well-characterized using state-of-the-art measurement methods and/or techniques for the determination of chemical compositon and physical properties. SRMs

Density Variations in Scanned Probe Oxidation

January 1, 2000
Author(s)
K Morimoto, F Perez-murano, John A. Dagata
The density of oxide nanostructures produced by scanned probe microscopy (SPM) is a function of substrate doping and voltage-pulse parameters. The total oxide thickness and molar-volume ratio of SPM oxide, obtained from high-resolution cross-sectional
Displaying 48426 - 48450 of 73697
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