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Displaying 48176 - 48200 of 73829

Folding and Assembly of Rhodopsin from Expressed Fragments

March 1, 2000
Author(s)
K D. Ridge, N G. Abdulaev
The dim-light photoreceptor rhodopsin is a prototypical member of the family of seven-transmembrane helix receptors that are coupled to guanine nucletide-binding proteins (G-proteins). Although chemical aspects of the membrane-embedded chromophore

Guiding Laser-Cooled Atoms in Hollow-Core Fibers

March 1, 2000
Author(s)
D Mueller, Eric A. Cornell, D Z. Anderson, E. Abraham
Laser-cooled atoms from a low-velocity atomic source are guided in a hollow-core optical fiber using the evanescent-wave dipole force from blue-detuned laser light launched into the glass region of the fiber. The transverse velocity of the guided atoms

Heterologous Expression of Bovine Opsin in Pichia Pastoris

March 1, 2000
Author(s)
N G. Abdulaev, K D. Ridge
The overproduction of bovine opsin and structurally related receptors in a variety of heterologous systems has so far proven quite difficult and consequently limited both biophysical and structural investigations. Therefore, a highly efficient expression

Hydrogels Formed by Endlinking PEG to Dendrimer Crosslink Agents

March 1, 2000
Author(s)
B D. Viers, Barry J. Bauer, Y A. Akpalu, F Groehn, Da-Wei Liu, G Kim
Hydrogels were formed by endlinking telechelic vinyl sulfone end-functionalized poly(ethylene glycol) with the terminal amines on dendrimers of different generation. These structures are unique in that the dendrimer crosslink sites were very large, and

Impact of Test-Structure Design and Test Methods for Electromigration Testing

March 1, 2000
Author(s)
S. Menon, J. Fazekas, Jochen von Hagen, Linda M. Head, Colleen E. Hood, Harry A. Schafft
The ultimate goal of this work is to develop design guidelines for electromigration test structures and to revise existing standard test methods for fast wafer-level and conventional package-level stress testing. These tests all involve stressing a sample

Influence of Polymer Melt Behavior on Flammability (NISTIR 6588)

March 1, 2000
Author(s)
Thomas J. Ohlemiller, Kathryn M. Butler
As the initial step in a study of the role of polymer melt viscosity in polymer burning behavior, a simpler, non-burning configuration has been examined. Vertical slabs of two types of polypropylene have been subjected to uniform radiative heating on one

Information-Based Manufacturing Program Summary and Accomplishments

March 1, 2000
Author(s)
David C. Stieren, Mark E. Luce
This report summarizes the Information-Based Manufacturing Program of the National Institute of Standards and Technology (NIST) by providing an overview of the program and highlighting key accomplishments that have been achieved. The Information-Based

MALDI-TOF Mass Spectrometry of Polymeric Silsesquioxanes

March 1, 2000
Author(s)
William E. Wallace, Charles M. Guttman, Joseph M. Antonucci
Matrix-assisted laser desorption ionization time-of-flight mass spectrometry has been shown to be an effective method to determine the degree-of-intramolecular-condensation of polymeric silsesquioxanes. The nature of the organic R' leaving group was found

Molecular Dynamics Study of Tethered Chains

March 1, 2000
Author(s)
Raymond D. Mountain, Joseph B. Hubbard, Curtis W. Meuse, V Simmons
The results of a series of molecular dynamics simulations of monolayer films formed by tethered, long chain molecules (octadecanthiol) are discussed. The emphasis is on the structure of the chains. The density profiles, the distribution of gauche defects

Morphological Stability of Ni(Al)/Ni 3 Al Nanolaminate Composites

March 1, 2000
Author(s)
J P. Fain, R Banerjee, Daniel Josell, P M. Anderson, H Fraser, N Tymiak, W Gerberich
This manuscript discusses the morphological instability observed when multilayered samples with alternating layers of γ-Ni(Al)/γ 1-Ni 3Al are exposed to 800 degrees}C for approximately 100 h. Samples with 20 nm / 20 nm or 120nm/120nm layer thickness and ir

National Voluntary Laboratory Accreditation Program (NVLAP) 2000 Directory

March 1, 2000
Author(s)
Vanda R. White
The NVLAP Directory is published annually and provides a listing of laboratories accredited by the National Voluntary Laboratory Accreditation Program (NVLAP), National Institute of Standards and Technology. Approximately 700 laboratories in 24 fields of

NIST Serial Holdings 2000

March 1, 2000
Author(s)
Susan A. Sanders, S S. Edwards
This publication contains bibliographic information on approximately 5,000 titles held in the NIST Research Library, representing current and noncurrent journals, periodicals, annuals, memoirs, proceedings, and transactions.

Noise-Optimized Silicon Radiometers

March 1, 2000
Author(s)
George P. Eppeldauer
Transimpedance-gain, loop-gain, and voltage-gain requirements of photodide short-circuit-current meters are summarized for ac and dc optical radiation measurements. Design considerations to implement the gain equations in silicon radiometers are discussed

Ontology Engineering for Distributed Collaboration in Manufacturing

March 1, 2000
Author(s)
L Pouchard, Nenad Ivezic, Craig I. Schlenoff
The problems of inter-operability are acute for manufacturing applications, as applications using process specifications do not necessarily share syntax and definitions of concepts. The Process Specification Language developed at the National Institute of
Displaying 48176 - 48200 of 73829
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