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Displaying 48101 - 48125 of 74296

Fast Imaging of Hard X-Rays With a Laboratory Microscope

July 1, 2000
Author(s)
A S. Bakulin, S M. Durbin, Terrence J. Jach, J Pedulla
An improved x-ray microscope with a fully electronic CCD detector system has been constructed that allows improved laboratory-based microstructural investigations of materials with hard x-rays. It uses the Kirkpatrick-Baez multilayer mirror design to form

Flammability of Polymer Clay Nanocomposites Consortium: Year One Annual Report (NISTIR 6531)

July 1, 2000
Author(s)
Jeffrey W. Gilman, Takashi Kashiwagi, A B. Morgan, Richard H. Harris Jr., L D. Brassell, Mark R. VanLandingham, C L. Jackson
We recently found that polymer layered-silicate (clay) nanocomposites have the unique combination of reduced flammability and improved physical properties. However, the details of the fire retardant mechanism were not well understood. In October of 1998 a

Fracture and the Structure of Silica

July 1, 2000
Author(s)
Stephen W. Freiman
Not only because of its historic and widespread use in applications where its strength and brittle nature are significant factors, but also because it is homogeneous in composition and structure, and isotropic in its properties, glass is an ideal medium in

Identification of Parameters in Multilayer Media

July 1, 2000
Author(s)
Edward Della Torre, R A. Fry, O Alejos, E Cardelli
Multilayer media are of increasing importance as magneto-optic and perpendicular media. The properties of successive layers evolve as the layers are epitaxially deposited. This complicates both the model for these media and the identification of the model

Identifying Critical Patches With ICAT

July 1, 2000
Author(s)
Peter M. Mell
[For the latest information on vulnerabilities, see the National Vulnerability Database, nvd.nist.gov]The NIST computer security division has created a searchable index containing 700 of the most important computer vulnerabilities. This index, called the

Improving the Accuracy of Particle Analysis

July 1, 2000
Author(s)
John A. Small, J R. Michael, Dale E. Newbury
Historically the procedures for the quantitative X-ray analysis of particles in the electron probe have been similar to the methods used for bulk electron probe samples.The main difference was that corrections had to be made to the experimental k-ratios or

Information Technology for Engineering and Manufacturing

July 1, 2000
Author(s)
James E. Fowler, Mark G. Carlisle
This paper summarizes material presented at Information Technology for Engineering & Manufacturing, a conference organized by NIST's Systems Integration for Manufacturing Applications (SIMA) program office to examine problems facing manufacturers as they

Integration of Manufacturing Simulations Using High Level Architecture (HLA)

July 1, 2000
Author(s)
Charles R. McLean, Swee K. Leong, Frank H. Riddick
This paper presents an overview of a neutral reference architecture for integrating distributed manufacturing simulation systems with each other, with other manufacturing software applications, and with manufacturing data repositories. Other manufacturing

Internet Commerce for Manufacturing Data Staging

July 1, 2000
Author(s)
C Parks, Jim G. Nell
This paper describes the process-flow model as proposed for use in the Internet Commerce for manufacturing (ICM), a project of the National Advanced Manufacturing Test Bed program. This model will be used to identify those internet-facilitated transactions

Low-Frequency Impedance Calibrations at NIST

July 1, 2000
Author(s)
Andrew D. Koffman, Yui-May Chang
This paper presents an overview of the low-frequency impedance measurement services offered through the Impedance Calibration Laboratory (ICL) at the National Institute of Standards and Technology (NIST). Emphasis will be given to recent improvements as

Management Data Specification for Supply Chain Integration

July 1, 2000
Author(s)
Yung-Tsun Lee, Shigeki Umeda
This document specifies a framework of communication data in a supply chain system, which is viewed as a virtual enterprise. First presented is a requirement analysis to identify the information necessary to represent the communication for the produciton
Displaying 48101 - 48125 of 74296
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