Koepke, G.
, Hill, D.
and Ladbury, J.
(2000),
Test Device Directivity for EMC Measurements, Proc. Electromagnetic Compatibility (EMC) Symposium, Washington, DC, USA (Accessed August 20, 2026)
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Test Device Directivity for EMC Measurements
Published
Author(s)
, ,
Proceedings Title
Proc. Electromagnetic Compatibility (EMC) Symposium
Conference Dates
August 21-25, 2000
Conference Location
Washington, DC, USA
Pub Type
Conferences
Citation
Issues
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Created July 31, 2000, Updated October 12, 2021