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Test Device Directivity for EMC Measurements

Published

Author(s)

Galen H. Koepke, David A. Hill, John M. Ladbury
Proceedings Title
Proc. Electromagnetic Compatibility (EMC) Symposium
Conference Dates
August 21-25, 2000
Conference Location
Washington, DC, USA

Citation

Koepke, G. , Hill, D. and Ladbury, J. (2000), Test Device Directivity for EMC Measurements, Proc. Electromagnetic Compatibility (EMC) Symposium, Washington, DC, USA (Accessed June 18, 2024)

Issues

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Created July 31, 2000, Updated October 12, 2021