Spectral Simulation With NIST-NIH Desktop Spectrum Analyzer (DTSA): A Critical Tool for Estimating Limits of Detection

Published

August 1, 2000

Author(s)

Dale E. Newbury

Abstract

X-ray microanalysis often must estimate limits of detection for specific specimen compositions to optimize analytical strategy and to adequately describe the results. Methods based upon direct measurement of real specimens are severely hampered by the lack of microhomogeneous standards of the correct multicomponent composition. Spectral synthesis with Desktop Spectrum Analyzer from first principles physics can provide sufficiently close simulation of real spectra that the synthesized spectra can be used to effectively calculate limits of detection. This approach also allows spectra deconvolution to predict limits of detection when spectral overlap exists.

Citation

Microscopy and Microanalysis

Volume

6

Issue

Suppl. 2

Pub Type

Journals

Keywords

electron probe x-ray microanalysis, energy dispersive x-ray spectrometry, limits of detection, microanalysis

Citation

Newbury, D. (2000), Spectral Simulation With NIST-NIH Desktop Spectrum Analyzer (DTSA): A Critical Tool for Estimating Limits of Detection, Microscopy and Microanalysis (Accessed May 4, 2024)