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Displaying 47926 - 47950 of 73929

Selected Programs at the New SURF III Electron Storage Ring

June 1, 2000
Author(s)
Mitchell L. Furst, Uwe Arp, G P. Cauchon, A D. Hamilton, L R. Hughey, Thomas B. Lucatorto, Charles S. Tarrio
The conversion of the electron storage ring at NIST (the National Institute of Standards and Technology) to SURF III (the Synchrotron Ultraviolet Radiation Facility) has resulted in a significant improvement to the azimuthal uniformity of magnetic field as

Structural Studies of Pulsed-Laser-Deposited Ba 4 Fe 4 Ti 3 0 16 Oxide Films

June 1, 2000
Author(s)
Leonid A. Bendersky, R Maier, J L. Cohn, J J. Neumeier
In this paper the pulsed laser deposition on single-crystal Mg0 substrates of Ba(sub4)Fe(sub4)Ti(sub3)0(sub16) target has been studied by TEM and x-ray diffraction. For [100] and [111] orientations of the substrate, the initial stage of the deposition

Superconductor Measurement Techniques and Cryostat Design

June 1, 2000
Author(s)
John (Jack) W. Ekin
This introduction to measurement cryostat design includes illustrations of several practical cryostats for testing low-current thin-films and high-current bulk superconductors. Heat transfer is the heart of most cryostat designs and illustrative

The Approaching Revolution in X-Ray Microanalysis: The Microcalorimeter Energy Dispersive Spectrometer

June 1, 2000
Author(s)
Dale E. Newbury, David A. Wollman, Gene C. Hilton, Kent D. Irwin, Norman F. Bergren, David A. Rudman, John M. Martinis
We have developed a high-resolution energy-dispersive x-ray spectrometer (EDS) based on cryogenic microcalorimeter x-ray detectors for use in x-ray microanalysis. With an energy resolution of 3 eV at 1.5 keV, count rate of {approximately} 500 s -1, and an

The Effect of an Oxidized Gold Substrate on Alkanethiol Self-Assembly

June 1, 2000
Author(s)
John T. Woodward IV, Marlon L. Walker, Curtis W. Meuse, David J. Vanderah, G Poirier, Anne L. Plant
UV cleaned gold substrates incubated in solutions of alkanethiol show islands on the monolayer surface when imaged with non-contact atomic force microscopy (AFM). The height of the islands above the monolayer is approximately twice the height of the

The Neolithography Consortium

June 1, 2000
Author(s)
James E. Potzick
The role of process simulation in microlithography is becoming an increasingly important part of process control as wafer feature sizes become smaller than the exposure wavelength, because the pattern transfer from photomask to wafer is nonlinear. An

The NIST X-Ray Optics Calibration Interferometer (XCALIBIR)

June 1, 2000
Author(s)
Angela Davies, Christopher J. Evans, R Kestner, M Bremer
NIST's next generation interferometer (XCALIBIR) is a 300mm aperture, general-purpose interferometer designed to push the limits of optical testing. In this presentation we describe the design goals and performance results of the instrument to date.

Uncertainty in Primary Gas Flow Standards Due to Flow Work Phenomena

June 1, 2000
Author(s)
John D. Wright, Aaron N. Johnson
Static gravimetric and static volumetric gas flow standards are both affected by uncertainty components related to the measurement of the change of mass of gas within the inventory volume. In the process of diverting gas into the collection vessel, rapid

Valence-Shell Autoionization of NO

June 1, 2000
Author(s)
S H. Southworth, T A. Ferrett, Jonathan E. Hardis, Albert C. Parr, J L. Dehmer
Autoionization of valence and Rydberg states in NO over the 12.5-18 eV photon energy range was studied by vibrationally resolved photoelectron spectroscopy of the 2π orbital. Complex, oscillatory structure is observed in NO + (2Π -1) X 1ς + partial cross

Video Based Metrology

June 1, 2000
Author(s)
Theodore D. Doiron, John R. Stoup, Tsai Hong Hong, Marilyn N. Abrams
With the rapid growth of video-based measurement and inspection systems, we would like to determine the extent to which industry needs calibration artifacts and standardized methods for video metrology. We hope to open a dialog among users for discussing
Displaying 47926 - 47950 of 73929
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