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NIST Authors in Bold

Displaying 47176 - 47200 of 73970

Superconformal Electrodeposition of Copper in 500-90 nm Features

December 1, 2000
Author(s)
Thomas P. Moffat, Daniel Wheeler, W H. Huber, Daniel Josell
Superconformal electrodeposition of copper in 500 nm deep trenches ranging from 500 to 90 nm in width has been demonstrated using an acid cupric sulfate electrolyte containing chloride (C1), polyethylene glycol (PEG), and 3-meracapto- 1propanesulfonate

The Effect of Vibrational Relaxation of the Discharge Coefficient of Critical Flow Venturis

December 1, 2000
Author(s)
Aaron N. Johnson, John D. Wright, Shin-ichi Nakao, C L. Merkle, Michael R. Moldover
This paper identifies a new mechanism that can affect the discharge coefficient of critical nozzle flows. Specifically, vibrational relaxation effects are demonstrated to significantly influence the discharge coefficient of selected gases in critical

The Free Energy Surface of Supercooled Water

December 1, 2000
Author(s)
A Scala, Francis W. Starr, E LaNave, H E. Stanley, F Sciortino
We present a detailed analysis of the free energy surface of a well studied model of water in supercooled states. We propose a functional form for the liquid free energy supported by recent theoretical predictions [Y. Rosenfeld and P. Tarazona, Mol. Phys

The IMS Mission Architecture for Distributed Manufacturing Simulation

December 1, 2000
Author(s)
Frank H. Riddick, Charles R. McLean
This paper presents an overview of a neutral reference architecture for integrating distributed manufacturing simulation systems with each other, with other manufacturing software applications, and with manufacturing data repositories. Other manufacturing

Video Based Metrologly

December 1, 2000
Author(s)
Theodore D. Doiron, Tsai H. Hong, John R. Stoup, Marilyn N. Abrams
Video cameras are increasingly used to make dimensional measurements. Many of these systems use interpolation of the pixel data, with some systems claiming to find edges with precision of 1/100 of a pixel. We have studied the response of single pixels of a

What Is This Thing Called Conformance?

December 1, 2000
Author(s)
Lynne S. Rosenthal, Mary C. Brady
XML developers claim they do it. OASIS, NIST, and W3C are building it. And, standards often require it. What is it?Conformance is usually defined as a way to determine if an implementation faithfully meets the requirements of a standard or specification

What Metrology Gains With Quantized Resistance Standards

December 1, 2000
Author(s)
Randolph E. Elmquist
The emergence of quantum metrology is expressed in modern electrical standards, primarily through the Josephson effect and the quantum Hall effect. The Josephson and von Klitzing constants that relate to these standards are given in quantum theory by ideal

Workability of Self-Compacting Concrete

December 1, 2000
Author(s)
Chiara F. Ferraris, L Brower, C H. Ozyildirim, J A. Daczko
The slump test is widely used to evaluate the workability of Concrete. However it has serious drawbacks, especially for self-compacting concrete (SCC). Other flow characteristics such as viscosity or filling capacity or time of flow through an orifice are

Balancing the Environmental and Economic Performance of Products.

November 30, 2000
Author(s)
Barbara C. Lippiatt, A S. Boyles
How do you select environmentally preferable products? Is a product environmentally preferable if it has recycled content? Is it not preferable if it offgasses during use? Are mainstream products always less preferable than products marketed and perceived

DASA Laser Range Camera Evaluation

November 30, 2000
Author(s)
C Chow, Michael O. Shneier
The DASA Laser Range Camera is a novel sensor that can be used to capture range images over distances from 0.5 meters to 30 meters, depending on the configuration. Unlike most laser ranging devices, it captures a whole image at once, rather than scanning

Java-Based XML Utility for the NIST Machine Tool Data Repository

November 30, 2000
Author(s)
Joseph A. Falco
The National Institute of Standards and Technology (NIST) is developing a specification for a standard format to represent machine tool performance test data. This data is used for machine acceptance, predictive maintenance, error compensation, and to

Federal Information Technology Security Assessment Framework

November 28, 2000
Author(s)
E Roback
[Prepared for the CIO Council's Security, Privacy, and Critical Infrastructure Committee] The Federal Information Technology (IT) Security Assessment Framework (or Framework) provides a method for agency officials to 1) determine the current status of

Infrared Spectroscopic Ellipsometry of Self-Assembled Monolayers

November 28, 2000
Author(s)
Curtis W. Meuse
Ellipsometry measures the relative intensity of and the phase difference between the parallel (p) and perpendicular (s) components of an electric field vector interacting with a sample. In this paper, a technique using polarized Fourier transform infrared

Design and Optimization of a Diode-Pumped Fiber-Coupled Yb:Er Glass Waveguide Laser

November 20, 2000
Author(s)
W. Liu, S. N. Houde-Walter, D. L. Veasey, A P. Peskin
An adaptive simulated annealing optimization algorthm is used to derive laser rate equation and wavegurding models with which the best design for a diode-pumped fiber-coupled, Yb. Er glass waveguide laser can be determined. Material parameters that

A Low Temperature STM Facility for the Study of Quantum and Spin Electronic Systems

November 15, 2000
Author(s)
Joseph A. Stroscio, Robert Celotta, Steven R. Blankenship, E Hudson, Aaron P. Fein
We describe an experimental system with the goal of providing new measurement capabilities for the study of quantum and spin electronic systems on the nanometer scale. The physical information desired in such systems includes: the quantized electron energy

NIST Centennial Celebration Symposium Highlight

November 15, 2000
Author(s)
Alan D. Mighell, Winnie K. Wong-Ng
The Centennial Celebration of the National Institute of Standards and Technology (NIST), formerly known as the Bureau of Standards (NBS), takes place in the year 2001. NIST has a long history (>50 years) of crystallographic research, and has made

NIST/SEMATECH Collaboration: Application of Nano-Tips to Production CD-SEMs

November 15, 2000
Author(s)
Andras Vladar, Michael T. Postek
This work documents the first part of a two-part study about the application of nano-tips to critical dimension (CD) scanning electron microscopes used in integrated circuit production. Nano-tips, by comparison to all conventional cold, thermally assisted
Displaying 47176 - 47200 of 73970
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