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Displaying 46901 - 46925 of 74171

NIST News from the Optoelectronics Division, Boulder, CO

January 1, 2001

Author(s)

Thomas Scott

The Optoelectronics Division supports the optoelectronics industry by providing new measurement techniques and standards to help characterize and assure the quality of their products.

NIST Physics Laboratory WWW page

January 1, 2001

Author(s)

Robert A. Dragoset, A R. Kishore, Karen J. Olsen, Alicia M. Sansonetti, D J. Schwab, G G. Wiersma

NIST recommended practice guide ::particle size characterization/

January 1, 2001

Author(s)

Stanley J Dapkunas, Ajit Jillavenkatesa

NIST recommended practice guide ::Rockwell hardness measurement of metallic materials/

January 1, 2001

Author(s)

Samuel R Low

NIST recommended practice guide ::surges happen! how to protect the applicances in your home/

January 1, 2001

Author(s)

Francois Martzloff

NIST recommended practice guide ::the fundamentals of neutron powder diffraction/

January 1, 2001

Author(s)

John R D Copley

NIST recommended practice guide ::the use of nomenclature in dispersion science and technology/

January 1, 2001

Author(s)

Chiara F Ferraris, Vincent A Hackley

NIST Recommended Practice Guide: Particle Size Characterization

January 1, 2001

Author(s)

Ajitkumar Jillavenkatesa, Lin-Sien H. Lum, Stanley Dapkunas

This guide is a compilation of essential facts and some fundamental information about commonly used techniques of particle size analysis in the ceramics industry. The guide is designed for the non- expert who may have some or little previous knowledge

NIST Recommended Practice Guide: Rockwell Hardness Measurement of Metallic Materials

January 1, 2001

Author(s)

Samuel R. Low III

The Rockwell hardness test continues to be applied as a tool for assessing the properites of a product while the tolerances on the acceptable material hardness have become tighter and tighter. Adhering to good practice procedures when performing Rockwell

NIST Response to the 6th CORM Report: Pressing Problems and Projected National Needs in Optical Radiometry

January 1, 2001

Author(s)

Keith R. Lykke, Gerald T. Fraser, Albert C. Parr

NIST Response to the 6th CORM Report: Pressing Problems and Projected National Needs in Optical Radiometry,

January 1, 2001

Author(s)

Keith R. Lykke, Gerald T. Fraser, Albert C. Parr

NIST response to the 6th CORM report::pressing problems and projected national needs in optical radiometry

January 1, 2001

Author(s)

Albert C Parr, Gerald T Fraser, Keith R Lykke

NIST Role in Radiometric Calibrations for Remote Sensing Program at NASA, NOAA, DOE and DOD

January 1, 2001

Author(s)

Raju V. Datla, Albert C. Parr

NIST serial holdings:

January 1, 2001

Author(s)

Susan A Sanders, Susan A Sanders, Shirley Edwards

NIST sparse BLAS user's guide:

January 1, 2001

Author(s)

Roldan Pozo, Karin A Remington

NIST special database 29::plain and rolled images from paired fingerprint cards

January 1, 2001

Author(s)

Craig I Watson

NIST special database 30::dual resolution images from paired fingerprint cards

January 1, 2001

Author(s)

Craig I Watson

NIST Time and Frequency Broadcasts from Radio Stations WWVB, WWV, and WWVH

January 1, 2001

Author(s)

Matthew J. Deutch, E Farrow, John P. Lowe, Glenn K. Nelson, Dean T. Okayama, D Patterson, Douglas D. Sutton, William C. Yates