NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 46726 - 46750 of 73697

Theory of a magnetic microscope with nanometer resolution

January 1, 2001
Author(s)
P Johansson, S Apell, David R. Penn
We propose a theory for a type of apertureless scanning near field microscopy that is intended to allow the measurement of magnetism on a nanometer length scale. A scanning tunneling microscope (STM) is used to scan a magnetic substrate while a laser is

Thermal Activation Under Shear

January 1, 2001
Author(s)
John W. Cahn, F R. Nabarro
Becker in 1925 and Mott and Nabarro in 1948 gave different expressions for the stress dependence of activation energy for shear in the limit when the stress approaches that at which plastic deformation can occur without thermal activation. We show that

Thickness measurement of nm HfO2 films

January 1, 2001
Author(s)
Kyung Joong KIM, A Kim, S.C. Kim, S.W. Song, H. Ruh, W.E.S. Unger, J. Radnik, J. Mata-Salazar, J.M. Juarez-Garcia, O. Cortazar-Martinez, A. Herrera-Gomez, P.E. Hansen, J.S. Madsen, C.A. Senna, B.S. Archanjo, J.C. Damasceno, C.A. Achete, H. Wang, M. Wang, Donald Windover, Eric B. Steel, A. Kurokawa, T. Fujimoto, Y. Azuma, S. Terauchi, L. Zhang, W.A. Jordaan, S.J. Spencer, A.G. Shard, L. Koenders, M. Krumrey, I. Busch, C. Jeynes
A pilot study for the thickness measurement of HfO2 films was performed by the Surface Analysis Working Group (SAWG) of the Consultative Committee for Amount of Substance (CCQM). The aim of this pilot study was to ensure the equivalency in the measurement

Three-Domain Architecture of Stress-Free Epitaxial Ferroelectric Films

January 1, 2001
Author(s)
Alexander L. Roytburd, S P. Alpay, V Nagarajan, Leonid A. Bendersky, R Ramesh
Epitaxial ferroelectric films undergoing a cubic-tetragonal phase transformation relax internal stresses due to the structural phase transformation and the difference in the thermal expansion coefficients of the film and the substrate by forming polydomain

Tool Wear and Surface Finish in High Speed Milling Aluminum Bronze

January 1, 2001
Author(s)
Matthew A. Davies, Kate Medicus, Christopher J. Evans, Brian S. Dutterer, R S. Fielder
Aluminum bronze C95800 is used extensively for the manufacture of propellers, because of its mechanical strength and corrosion resistance. Typically these components are machined from large castings and then hand ground and polished. In this work, we

Tool Wear and Surface Finish in High Speed Milling of Aluminum Bronze

January 1, 2001
Author(s)
Kate Medicus, Matthew A. Davies, Brian S. Dutterer, Christopher J. Evans, R S. Fielder
Aluminum bronze C95800 is used extensively for the manufacture of propellers, because of its mechanical strength and corrosion resistance. Typically these components are machined from large castings and then hand ground and polished. In this work, we

Tools and Diagnostics for Projection Display Metrology

January 1, 2001
Author(s)
Paul A. Boynton
Electronic projection display specifications are often based on measurements made in ideal darkroom conditions and assume ideal measurement instrumentation. However, not everyone has access to such a facility, and not always will the light-measuring

Trapping Atoms With Evanescent Light Fields From Integrated Optical Waveguides

January 1, 2001
Author(s)
J P. Burke, S T. Chu, Garnett W. Bryant, Carl J. Williams, P S. Julience
We theoretically investigate three approaches to trapping atoms above linear integrated optical waveguides. A two-color scheme balances the decaying evanescent fields of red-and blue-detuned light to produce a potential minimum above the guide. A one-color
Displaying 46726 - 46750 of 73697
Was this page helpful?