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Displaying 46701 - 46725 of 73460

Collaboration Between NPL and NIST

November 7, 2000
Author(s)
K B. Gebbie
Since its inception in 1901, the National Institute of Standards and Technology (NIST) (then the National Bureau of Standards) has sought guidance from its sister institute, the National Physical Laboratory. For almost a century, the two institutions have

Cooper Minima in the Photoemission Spectra of Solids

November 6, 2000
Author(s)
S Molodtsov, S Halilov, V Servedio, W Schneider, S Danzenbaecher, J Hinarejos, M Richter, C Laubschat
Variations of the photoionization cross-section of valence states as a function of interatomic distance are studied by means of atomic and solid-state density functional approaches and compared with photoemission data. In contrast to the free atom case, a

Open Architecture Controls: The Key to Interoperability

November 2, 2000
Author(s)
John Evans
Integration costs for industrial robots are two to four times the cost of the robots themselves. As manufacturers work toward ever shorter product cycles and lower production costs, integration costs for manufacturing systems is becoming increasingly

A Shape Modeling Application Program Interface (API) for the STEP Standard

November 1, 2000
Author(s)
Mike Pratt, B D. Anderson
The international standard ISO 10303 for the exchange of product models and associated data between different computer aided design (CAD) and other engineering systems was first issued in 1994. This paper reports on current work on extending the standard

A Web-Based Process/Material Advisory System

November 1, 2000
Author(s)
Y Chen, Satyandra K. Gupta, Shaw C. Feng
This paper describes a web-based process/material advisory system that can be used during conceptual design. Given a set of design requirements for a part during conceptual design stage, our system produces process sequences that can meet the design

Accelerating Scientific Discovery through Computation and Visualization

November 1, 2000
Author(s)
James S. Sims, John G. Hagedorn, Peter M. Ketcham, Steven G. Satterfield, Terence J. Griffin, William L. George, H A. Fowler, B A. am Ende, Howard Hung, Robert B. Bohn, John E. Koontz, Nicos Martys, Charles E. Bouldin, James A. Warren, D L. Feder, Charles W. Clark, Bernard J. Filla, Judith E. Terrill
The rate of scientific discovery can be accelerated through computation and visualization. This acceleration results from the synergy of expertise, computing tools, and hardware for enabling high performance computation, information science, and

Aerodynamic Study of a Vane-Cascade Swirl Generator

November 1, 2000
Author(s)
J F. Widmann, S R. Charagundla, Cary Presser
The air flow through a vane-cascade swirl generator is examined both experimentally and numerically to characterize the inlet combustion air flow entering a reference spray combustion facility at NIST. A three-dimensional model is used to simulate the

Al, B, and Ga Ion-Implantation Doping of SiC

November 1, 2000
Author(s)
E Handy, M V. Rao, O W. Holland, P Chi, K A. Jones, M A. Derenge, R D. Vispute, T Venkatesan
A Series of single energy Al, B, and Ga ion implants were performed in the energy range 50 keV - 4 MeV into 6H-SiC to characterize the implant depth profiles using secondary ion mass spectrometry (SIMS). From the implant depth profiles empirical formulae

An Assessment Standard for the Evaluation of Display Measurement Capabilities

November 1, 2000
Author(s)
John M. Libert, Paul A. Boynton, Edward F. Kelley, Steven W. Brown, Yoshi Ohno
A prototype display measurement assessment transfer standard (DMATS) is being developed by NIST to assist the display industry in standardizing measurement methods used to quantify the performance of electronic displays. Designed as an idealized electronic

Calibration of High-Resolution X-Ray Tomography with Atomic Force Microscopy

November 1, 2000
Author(s)
A Kalukin, B Winn, Yong Wang, C Jacobsen, Z Levine, Joseph Fu
For two-dimensional x-ray imaging of thin films, the technique of scanning transmission x-ray microscopy (STXM) has achieved images with feature sizes as small as 40 nm in recent years. However, calibration of three-dimensional tomographic images that are

Calibration of High-Resolution X-Ray Tomography With Atomic Force Microscopy

November 1, 2000
Author(s)
A R. Kalukin, B Winn, S S. Wang, C Jacobsen, Zachary H. Levine, Joseph Fu
For two-dimensional x-ray imaging of thin films, the technique of scanning transmission x-ray miscroscopy (STXM) has achieved images with feature sizes as small as 40 nm in recent years. However, calibration of three-dimensional tomographic images that are

CODATA Recommended Values of the Fundamental Physical Constants: 1998

November 1, 2000
Author(s)
Peter J. Mohr, Barry N. Taylor
This paper gives the 1998 self-consistent set of values of the basic constants and conversion factors of physics and chemistry recommended by the Committee on Data for Science and Technology (CODATA) for international use. Further, it describes in detail

Combined 63,65 Cu NQR and NMR Study of Y 1-x Ca x Ba 2 Cu 3 O y

November 1, 2000
Author(s)
D M. Potrepka, J. I. Budnick, A R. Moodenbaugh, Daniel A. Fischer, W A. Hines
Zero-field 63,65Cu nuclear quadrupole resonance (NQR) and nuclear magnetic resonance (NMR) spectra were obtained at 1.3 K for powdered samples of Y 1-xCa xBa 2Cu 3O y with 0 less than or equal to} x less than or equal to} 0.20. The results for the

Countermeasures for Mobile Agent Security

November 1, 2000
Author(s)
Wayne Jansen
Security is an important issue for the widespread deployment of applications based on agent technology. It is generally agreed that without the proper countermeasures in place, use of agent-based applications will be severely impeded. However, not all

Cross Comparison of Direct Strength Testing Techniques on Polysilicon Films

November 1, 2000
Author(s)
D A. LaVan, T Tsuchiya, G Coles, W G. Knauss, I Chasiotis, David T. Read
Several direct and indirect testing techniques to characterize the strength and distribution in strength of structural thin films have been developed with widely varying results appearing in the literature (roughly 1 to 4 GPa for polysilicon). Much of the

Damage-Resistant Brittle Coatings

November 1, 2000
Author(s)
Brian R. Lawn, K S. Lee, Herzl Chai, Antonia Pajares, D K. Kim, S Wuttiphan, I M. Peterson, X Z. Hu
A conceptually new approach to the design of brittle coating structures on soft substrates, based on prevention of crack initiation rather than on customary crack containment, is outlined. Concentrated loads produce two competing coating fracture modes
Displaying 46701 - 46725 of 73460
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