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Search Publications

NIST Authors in Bold

Displaying 45701 - 45725 of 73697

Mechanisms and Measurement of Oxidative Damage to DNA

March 1, 2001
Author(s)
M. Dizdaroglu, Pawel Jaruga, H Rodriguez
Free radicals are produced in cells by normal metabolism and by exogenous sources. These species cause oxidative damage to DNA and generate multiple products including modified bases and sugars, strands breaks and DNA-protein crosslinks by a variety of

Meta-Analysis of Face Recognition Algorithms

March 1, 2001
Author(s)
P J. Phillips, E M. Newton
To obtain a quantitative assessment of the state of automatic face recognition, we performed a meta-analysis of performance results of face recognition algorithms in the literature. The analysis was conducted on 24 papers that report identification

Metrology for Non-Contact Rainbow Thermometry

March 1, 2001
Author(s)
Cary Presser
NIST recently acquired a commercially available, state-of-the-art droplet diagnostic system that determines the size, velocity, and temperature of in-flight individual droplets. This non-contact diagnostic will be used to determine droplet characteristics

Microfabricated Transition-Edge X-ray Detectors

March 1, 2001
Author(s)
Gene C. Hilton, John M. Martinis, Kent D. Irwin, Norman F. Bergren, David A. Wollman, Martin Huber, Sae Woo Nam
We are developing high performance x-ray detectors based on superconducting transition-edge sensors (TES) for application in materials analysis and astronomy. Using our recently developed fully lithographic TES fabrication process, we have made devices

Model of a Fiber-Optic Evanescent-Wave Fluorescence Sensor

March 1, 2001
Author(s)
D L. Woerdeman, Richard~undefined~undefined~undefined~undefined~undefined Parnas
A fiber-optic cure sensor based on evanescent wave fluorescence spectroscopy has been designed to probe the interphase region of glass-reinforced composites. The size of the interphase can vary significantly, d epending on the exact nature of the fiber

Modeling Illumination-Mode Near-Field Optical Microscopy of Au Nanoparticles

March 1, 2001
Author(s)
A Liu, A Rahmani, Garnett W. Bryant, Lee J. Richter, Stephan J. Stranick
We present a theoretical analysis of near-field scanning optical microscopy (NSOM) images of small Au particles made in illumination mode. We model the metal-coated fiber tip as a thin disk consisting of a glass core and an aluminum coating. An external

Nanoindentation of Polymers: An Overview

March 1, 2001
Author(s)
Mark R. VanLandingham, John S. Villarrubia, William F. Guthrie, G F. Meyers
Indentation measurements made with atomic force microscopy (AFM) probes are relative measurements, largely due to the lack of information regarding the tip shape of the AFM probes. Also, current tip shape calibration procedures used in depth-sensing

NIST-Sponsored Interlaboratory Comparison of Polystyrene Molecular Mass Distribution Obtained by Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometry: Statistical Analysis

March 1, 2001
Author(s)
Charles M. Guttman, S Wetzel, William R. Blair, B M. Fanconi, Kathleen M. Flynn, R J. Goldschmidt, William E. Wallace, David L. VanderHart
Matrix-assisted laser desorption/ionization time of flight mass spectrometry (MALDI-TOF-MS) is becoming a new and important technique in synthetic polymer characterization. Yet much is still unknown about the molecular mass distribution (MWD) which is

Noncontact Thermometry in the Optical Technology Division at NIST

March 1, 2001
Author(s)
Charles E. Gibson, Howard W. Yoon, Benjamin K. Tsai, Bettye C. Johnson, Robert D. Saunders
The Optical Technology Division (OTD) at the National Institute of Standards and Technology (NIST) maintains the thermodynamic temperature scale above the silver freezing point using spectral radiance ratios according to the International Temperature Scale

On the Gibbs Adsorption Equation for Diffuse Interface Models

March 1, 2001
Author(s)
Geoffrey B. McFadden, A A. Wheeler
In this paper we discuss some applications of the classical Gibbs adsorption equations to specific diffuse interface models that are based on conserved and non-conserved order parameters. Such models are natural examples of the general methodology

On-Wafer Measurements of Nonlinear Effects in High Temperature Superconductors

March 1, 2001
Author(s)
James Booth, Leila R. Vale, Ronald H. Ono
We present the results of comprehensive on-wafer microwave probe station measurements of the nonlinear properties of coplanar waveguide devices patterned from HTS thin films. We introduce a sequence of measurements and analysis that is designed to describe

Optical Metrology for Wavelength-Division-Multiplexed Fiber Communications

March 1, 2001
Author(s)
Sarah L. Gilbert, Shellee D. Dyer, Paul A. Williams, Allen Rose
In response to rapid changes in fiber-optic technology, the Optoelectronics Division of the National Institute of Standards and Technology has been developing techniques and standards to support the measurement of optical components and subsystems used in

Optical Path Difference Measurement Techniques for SLMs

March 1, 2001
Author(s)
Patrick J. Grother, D P. Casasent
A simple measurement method to obtain 2-D spatial point-by-point optical path difference (OPD) data for spatial light modulators (SLMs) is described. A simple imaging system is used that allows measurements of all SLM parameters on the same laboratory

Periodic Table: Atomic Properties of the Elements

March 1, 2001
Author(s)
Robert A. Dragoset
Periodic Table: Atomic Properties of the Elements. This is version 2, which incorporates previously published revisions of mass numbers for some stable isotopes.

Quantum Chemistry

March 1, 2001
Author(s)
Carlos A. Gonzalez
In this short essay, the current status of quantum chemistry as well as the future challenges this discipline have to face in order to become a useful tool in the investigation of large-scale chemical problems is presented.
Displaying 45701 - 45725 of 73697
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