U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 44826 - 44850 of 74167

Thermal Degradation and Flammability Properties of Polypropylene-Carbon Nanotube Composites

January 1, 2002
Author(s)
Takashi Kashiwagi, E Grulke, J Hilding, Richard H. Harris Jr., W H. Awad, J. F. Douglas
Nanocomposites based on polypropylene and carbon nanotubes (up to 2 vol.-%) were melt blended, yielding a good dispersion of nanotubes without using any organic treatment or additional additives. Carbon nanotubes are found to significantly enhance the

Thermal Response and Inequivalence of Pulsed Ultraviolet-Laser Calorimeters

January 1, 2002
Author(s)
D X. Chen, Marla L. Dowell, Christopher L. Cromer, Nien F. Zhang
A finite element model has been developed to study the thermal response of pulsed-laser calorimeters. Comparisons between pulsed- and average-laser power heating will be shown. Comparisons between laser and electrical heating will be presented and the

Thermal Shock Resistance of Silicon Nitrides Using an Indentation-Quench Test

January 1, 2002
Author(s)
S K. Lee, J D. Moretti, Brian R. Lawn
The thermal shock resistance of silicon nitrides is investigated using an indentation-quench procedure. Four grades of commercially available silicon nitrides with different microstructures are investigated. The extension of Vickers radial cracks is

Thermodynamics of Metal Agent Fire Extinguishment

January 1, 2002
Author(s)
J D. Mather, R E. Tapscott
The thermodynamics of oxides, carbonates, halides and related metal compounds involved in extinguishment by dry chemicals and metal agents has been analyzed. It is shown that lattice energies play an important role in determining the extinguishment

Toward Traceability for At Line AFM Dimensional Metrology

January 1, 2002
Author(s)
Ronald G. Dixson, Angela Guerry, Marylyn H. Bennett, Theodore V. Vorburger, Michael T. Postek
The in-line and at-line measurement tools for critical dimension (CD) metrology in semiconductor manufacturing are technologically advanced instruments that exhibit excellent measurement repeatability--below 1 nm in some cases. Accuracy, however, is
Displaying 44826 - 44850 of 74167
Was this page helpful?