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Displaying 44076 - 44100 of 74045

An Intelligent Systems Architecture for Manufacturing (ISAM); A Reference Model Architecture for Intelligent Manufacturing Systems

January 1, 2002
Author(s)
James S. Albus, John A. Horst, Hui-Min Huang, Thomas Kramer, Elena R. Messina, Alex Meystel, John L. Michaloski, Frederick M. Proctor, Harry A. Scott, Edward J. Barkmeyer Jr., M. K. Senehi
The Intelligent Systems Architecture for Manufacturing (ISAM) addresses the application of intelligent systems to the manufacturing enterprise at three degrees of abstraction: 1) a conceptual framework for developing metrics, standards, and performance

Applications of Artificial Neural Networks to RF and Microwave Measurements

January 1, 2002
Author(s)
Jeffrey Jargon, Kuldip Gupta, Donald C. DeGroot
This article describes how artificial neural networks (ANNs) can be used to benefit a number of RF and microwave measurement areas including vector network analyzer (VNA) calibrations, power, and material characterization. We apply ANNs to model a variety

Architecture for a Large-Scale Ion-Trap Quantum Computer

January 1, 2002
Author(s)
D Kielpinski, C R. Monroe, David J. Wineland
Among the numerous types of architecture being explored for quantum computers are systems utilizing ion traps, in which quantum bits (qubits) are formed from the electronic states of trapped ions and coupled through the Coulomb interaction. Although the

Artificial Molecules

January 1, 2002
Author(s)
W Jaskolski, Garnett W. Bryant, J Planelles, M Zielinski

Atom Optics

January 1, 2002
Author(s)
M Prentiss, William D. Phillips, Editors

Atomic Time

January 1, 2002
Author(s)
Thomas E. Parker, Marc A. Weiss
Displaying 44076 - 44100 of 74045
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