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Repeat Measurements and Metrics for Nonlinear Model Development

Published

Author(s)

Catherine A. Remley, Jeffrey A. Jargon, Dominique Schreurs, Donald C. DeGroot, Kuldip Gupta

Abstract

We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different metrics.
Volume
3
Conference Dates
June 2-7, 2002
Conference Location
Seattle, WA
Conference Title
2002 IEEE MTT-S International Microwave Symposium

Keywords

large-signal measurements, measurement based models, model evaluation meters, nonlinear circuits, nonlinear network analysis

Citation

Remley, C. , Jargon, J. , Schreurs, D. , DeGroot, D. and Gupta, K. (2002), Repeat Measurements and Metrics for Nonlinear Model Development, 2002 IEEE MTT-S International Microwave Symposium, Seattle, WA, [online], https://doi.org/10.1109/MWSYM.2002.1012301 (Accessed May 16, 2022)
Created June 6, 2002, Updated January 27, 2020