Repeat Measurements and Metrics for Nonlinear Model Development
Catherine A. Remley, Jeffrey A. Jargon, Dominique Schreurs, Donald C. DeGroot, Kuldip Gupta
We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different metrics.
large-signal measurements, measurement based models, model evaluation meters, nonlinear circuits, nonlinear network analysis
, Jargon, J.
, Schreurs, D.
, DeGroot, D.
and Gupta, K.
Repeat Measurements and Metrics for Nonlinear Model Development, 2002 IEEE MTT-S International Microwave Symposium, Seattle, WA, [online], https://doi.org/10.1109/MWSYM.2002.1012301
(Accessed May 16, 2022)