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Repeat Measurements and Metrics for Nonlinear Model Development



Catherine A. Remley, Jeffrey A. Jargon, Dominique Schreurs, Donald C. DeGroot, Kuldip Gupta


We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different metrics.
Conference Dates
June 2-7, 2002
Conference Location
Seattle, WA
Conference Title
2002 IEEE MTT-S International Microwave Symposium


large-signal measurements, measurement based models, model evaluation meters, nonlinear circuits, nonlinear network analysis


Remley, C. , Jargon, J. , Schreurs, D. , DeGroot, D. and Gupta, K. (2002), Repeat Measurements and Metrics for Nonlinear Model Development, 2002 IEEE MTT-S International Microwave Symposium, Seattle, WA, [online], (Accessed April 21, 2024)
Created June 6, 2002, Updated January 27, 2020