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Displaying 43326 - 43350 of 143780

Transmission EBSD from 10 nm domains in a scanning electron microscope

March 1, 2012
Author(s)
Robert R. Keller, Roy H. Geiss
The spatial resolution of electron diffraction within the scanning electron microscope (SEM) has progressed from channelling methods capable of measuring crystallographic characteristics from 10 μm regions to electron backscatter diffraction (EBSD) methods

X-ray and Neutron Reflectivity and Electronic Properties of PCBM-poly(bromo)styrene Blends and Bilayers with Poly(3-hexylthiophene)

March 1, 2012
Author(s)
Stuart B. Kirschner, Nathaniel P. Smith, Kevin A. Wepasnick, Howard E. Katz, Brian Kirby, Julie Borchers, Daniel H. Reich
We used neutron reflectivity to complement x-ray reflectivity characterization of PCMB-based layers formed on poly(3-hexylthiophene) (P3HT). Single-layer analyses were used to provide reliable scattering length density values for bilayer fitting. Atomic

Fitting EXAFS data using molecular dynamics outputs and a histogram approach

February 29, 2012
Author(s)
Bruce D. Ravel, Stephen W. Price, Nicholas Zonias, Chris-Kriton Skylaris, Andrea Russell
It has been shown that for highly disordered systems, EXAFS underestimates coordination number and thus particle size when compared with the theoretical coordination number based on size determination from other experimental techniques1-4. Similarly, when

The 2009 Materials Science &Technology Conference & Exhibition (MS&T09)

February 29, 2012
Author(s)
Winnie Wong-Ng
The 2009 Materials Science and Technology Conference and Exhibition (MS&T09) took place at the David L. Lawrence Convention Center in Pittsburgh , Pennsylvania, from October 25-29. The Conference was the leading forum addressing structure, properties

VCI Simulation with Semiconductor Device Models: Test Report

February 29, 2012
Author(s)
John S. Villarrubia
JMONSEL, an electron beam imaging simulator, has been modified to permit conducting regions of a sample to be designated as unconnected to an external source or sink of charge (floating) or, alternatively, to be connected with a user-specified relaxation

Determination of Low-Level Sulfur Concentrations by Isotope Dilution Multi-Collector Inductively Couple Plasma Mass Spectrometry (D-MC-ICPMS) Using 33S Spike and Internal Normalization for Mass Bias Correction

February 28, 2012
Author(s)
Jacqueline L. Mann, Robert D. Vocke Jr., William R. Kelly
An isotope dilution (ID) multi-collector inductively coupled plasma mass spectrometry (MC-ICPMS) method combined with an internal normalization approach for mass bias correction has been used to determine low-level sulfur (S) concentrations in a

Halothane Changes the Domain Structure of a Binary Lipid Membrane

February 28, 2012
Author(s)
Michael Weinrich, Hirsh Nanda, David Worcester, Charles Majkrzak, Brian B. Maranville, Sergey M. Bezrukov
X-ray and neutron diffraction studies of model lipid raft membranes demonstrate that halothane at physiological concnetrations produces redistribution of lipids between domains of different lipid types identified by different lamellar-d-spacings and

March 2012 SRM Spotlight.

February 28, 2012
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains
Displaying 43326 - 43350 of 143780
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