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Displaying 40576 - 40600 of 73963

40 Years of Metrology With Synchrotron Radiation at SURF

September 1, 2003
Author(s)
Uwe Arp, Steven E. Grantham, Simon G. Kaplan, Ping-Shine Shaw, Charles S. Tarrio, Robert E. Vest
the advantages of a compact synchrotron radiation source like the Synchrotron Ultraviolet Radiation Facility for metrology in the ultraviolet and extreme ultraviolet are shown. The capabilities of the different experimental stations are explained and

A Direct Comparison of Surface and Bulk Chain-Relaxation in Polystyrene

September 1, 2003
Author(s)
Wen-Li Wu, S Sambasivan, C M. Wang, William E. Wallace, Jan Genzer, Daniel A. Fischer
Near-edge x-ray absorption fine structure (NEXAFS) spectroscopy was used to meausre simultaneously the relaxation rates of polystyrene (PS) molecules at the free surface and in the bulk. The samples were uniaxially stretched and annealed at temperatures

A Four-Zone Furnace for Realization of Silver and Gold Freezing Points

September 1, 2003
Author(s)
Dean C. Ripple, K Garrity, Christopher W. Meyer
Recently, the Thermocouple Calibration Laboratory at the National Institute of Standards and Technology has used sodium heat-pipe furnaces for the realization of ITS-90 freezing points of aluminum, silver, and gold. When using a fixed-point cell mounted in

Abrasive Machining of Porcelain and Zirconia With a Dental Handpiece

September 1, 2003
Author(s)
L Yin, S Jahanmir, L K. Ives
The machining characteristics and material removal mechanisms of two dental ceramics feldspathic porcelain and yttria-stabilized tetragonal zirconia - were investigated using a dental handpiece and diamond burs with different grit sizes. The material

Active millimeter-wave imaging for concealed weapons detection

September 1, 2003
Author(s)
Erich N. Grossman, Aaron J. Miller
Actively illuminated mm-wave imaging systems for concealed weapons detection offer the possibility of much higher sensitivity than with passive systems. We discuss several issues specific to mm-wave imaging systems that are actively illuminated and

An Open Standard for Chemical Structure Representation: The IUPAC Chemical Identifier

September 1, 2003
Author(s)
Stephen E. Stein, Stephen R. Heller, Dmitrii V. Tchekhovskoi
IUPAC has long been involved in the development of systematic and standard procedures for naming chemical substances on the basis of their structure. The resulting rules of nomenclature, while covering almost all compounds, were designed for text-based

Basic Mass Metrology

September 1, 2003
Author(s)
Georgia L. Harris
Basic Mass Metrology CD-ROM training course. Course is designed to run after the CD is inserted in a Windows-based computer.

Bevel Depth Profiling SIMS for Analysis of Layer Structures

September 1, 2003
Author(s)
John G. Gillen, Scott A. Wight, P Chi, Albert J. Fahey, Jennifer R. Verkouteren, Eric S. Windsor, D. B. Fenner
We are evaluating the use of bevel depth profiling Secondary Ion Mass Spectrometry (SIMS) for the characterization of layered semiconductor materials. In this procedure, a sub-degree angle bevel is cut into the analytical sample with an oxygen or cesium

Cable-Based Metrology System for Sculpting Assistance

September 1, 2003
Author(s)
R L. Williams, James S. Albus, Roger V. Bostelman
ABSTRACT A novel cable-based metrology system is presented wherein six cables are connected in parallel from ground-mounted string pots to the moving object of interest. Cartesian pose can be determined for feedback control and other purposes by reading

Characterization of SiGe Bulk Compositional Standards with Electron Probe Microanalysis

September 1, 2003
Author(s)
Ryna B. Marinenko, J T. Armstrong, Shirley Turner, Eric B. Steel, F A. Stevie
Bulk SiGe wafers cut from single-crystal boules were evaluated with the electron probe microanalyzer (EPMA) for micro- and macroheterogeneity for use as primary standards for future characterization of SiGe thin films on Si that are needed by the

Cloning and Expression of the Gene for a Novel Protein From Mycobacterium Smegmatis With Functional Similarity to Eukaryotic Calmodulin

September 1, 2003
Author(s)
Prasad T. Reddy, C R. Prasad, P H. Reddy, D J. Reeder, K H. McKenney, H Jaffe, M N. Dimitrova, A Ginsburg, A Peterkofsky, P S. Murthy
The calmodulin-like protein from Mycobacterium smegmatis (MSM-CAMLP) was purified to homogeneity with a yield of about 1 g from 70 g of cells. Peptide sequence analysis of the MSM-CAMLP was used to design degenerate oligonucleotides for the eight

Combinatorial Characterization of Cell Interactions with Polymer Surfaces

September 1, 2003
Author(s)
J C. Meredith, J L. Sormana, B G. Keselowsky, A J. Garcia, Alessandro Tona, Alamgir Karim, Eric J. Amis
The combinatorial library and high-throughput techniques presented here allow rapid, efficient, and accurate exploration of the effects of microstructure and surface features on cell adhesion and proliferation. The new technique serves as a natural

Compact Solid-State Waveguide Lasers

September 1, 2003
Author(s)
Berton Callicoatt, John B. Schlager, Robert K. Hickernell, Richard Mirin, Norman Sanford
DBR and mode-locked Er/Yb waveguide lasers offer single-frequency and ultralow jitter performance.

Confinement Effects on Mositure Absorption Kinetics in Polyelectrolyte Films

September 1, 2003
Author(s)
B D. Vogt, Christopher L. Soles, Hae-Jeong Lee, Eric K. Lin, Wen-Li Wu
Quartz crystal microbalance (QCM) measurements were used to determine the absorption of water into thin poly(4-ammonium styrenesulfonic acid) films from saturated vapor at 25 C. The effect of film thickness on the absorption kinetics was investigated in

Conformational Analysis of the Jet-Cooled Peptide Mimetic Ethylacetamidoacetate from Torsion-Rotation Spectra

September 1, 2003
Author(s)
R J. Lavrich, Angela R. Hight Walker, David F. Plusquellic, I Kleiner, R D. Suenram, Jon T. Hougen, Gerald T. Fraser
Rotational spectra of two conformers of the dipeptide mimetic, ethyl acetamidoacetate, were measured in a molecular beam using a Fourier-transform microwave spectrometer. In each conformer, internal rotation of the acetyl methyl group gives rise to

Development of Metrology at NIST For the Semiconductor Industry

September 1, 2003
Author(s)
Stephen Knight
The National Institute of Standards and Technology metrology development for the semiconductor industry and its supporting infrastructure is a broad set of programs directed at many of the critical metrology needs. This paper will give examples of specific

Effects of Lightpipe Proximity on Si Wafer Temperature in Rapid Thermal Processing Tools

September 1, 2003
Author(s)
Kenneth G. Kreider, D H. Chen, D P. DeWitt, William A. Kimes, Benjamin K. Tsai
Lightpipe radiation thermometers (LPRTs) are the preferred temperature monitoring sensor in most rapid thermal processing (RTP) tools for semiconductor fabrication. These tools are used for dopant anneal, gate oxide formation, and other high temperature
Displaying 40576 - 40600 of 73963
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